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Effect of Substrate Temperature on the Structural and Optical Properties of Nanocrystalline Cadmium Selenide Thin Films Prepared by Electron Beam Evaporation Technique

100%

Suthan Kissinger N., Suthagar J., Saravana Kumar B., Balasubramaniam T., Perumal K.

issue 4

623-628

Cadmium selenide (CdSe) thin films on glass substrates were prepared by physical vapour deposition under vacuum using the electron beam evaporated technique for different substrate temperatures: room temperature, 100, 200, 300°C, respectively. X-ray diffraction analysis indicates that the films are polycrystalline, having hexagonal (wurtzite) structure irrespective of their substrate temperature. All the films show most preferred orientation along (0 0 2) plane parallel to the substrates. The microstructural parameters such as particle size, stress, strain and dislocation density were calculated. The grain size of deposited CdSe films is small and is within the range of 18 to 42 nm. The optical absorption spectra of electrom beam deposited CdSe films were studied in the wavelength region of 250-2500 nm. The energy gap (E_{g}) values (allowed direct transitions), calculated from the absorption spectra, ranged between 1.77 and 1.92 eV. The surface morphological quality of electron beam evaporated CdSe films were analyzed by scanning electron microscopy and atomic force microscopy.

Growth and Characterization of Wide-Gap Cd_{1-x}Zn_{x}Se Ternary Alloys by Using Electron Beam Evaporation Technique

100%

Suthagar J., Rajesh S., Perumal K., Balasubramaniam T., Suthan Kissinger N.

issue 3

506-511

Cd_{1-x}Zn_{x}Se films with different zinc content were deposited by electron beam evaporation technique onto glass substrates for the application of solid-state photovoltaic devices. The structural, surface morphological and optical properties of Cd_{1-x}Zn_{x}Se films have been studied in the present work. The host material, Cd_{1-x}Zn_{x}Se, has been prepared by the physical vapor deposition method of electron beam evaporation technique under the pressure of 1 × 10^{-5} mbar. The X-ray diffractogram indicates that these alloy films are polycrystalline in nature, of hexagonal structure with strong preferential orientation of the crystallites along (002) direction. Linear variation of lattice constant with composition (x) is observed. Surface roughness measured by atomic force microscopy is used to estimate the interface roughness. The optical properties show that the band gap (E_{g}) values vary from 2.08 to 2.64 eV as zinc content varies from 0.2 to 0.8. The surface morphological studies show the very small, fine and hardly distinguishable grains smeared all over the surface. The material properties would be altered and excellently controlled by adiusting the system composition x.

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2 Acta Physica Polonica A

2 2010

2 Balasubramaniam T.

2 Perumal K.

2 Suthagar J.

2 Suthan Kissinger N.

1 Rajesh S.

1 Saravana Kumar B.

Search results

Effect of Substrate Temperature on the Structural and Optical Properties of Nanocrystalline Cadmium Selenide Thin Films Prepared by Electron Beam Evaporation Technique

Growth and Characterization of Wide-Gap Cd_{1-x}Zn_{x}Se Ternary Alloys by Using Electron Beam Evaporation Technique