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1

Ultrasonic Spectroscopy of Silicon Single Crystal

100%

Sedlak P., Tofel P., Sedlakova V., Majzner J., Sikula J., Hasse L.

Metrology and Measurement Systems

|

2011

|

issue 4

2

Supercapacitor Degradation Assesment by Power Cycling and Calendar Life Tests

100%

Sedlakova V., Majzner J., Sikula J., Sedlak P., Kuparowitz T., Buergler B., Vasina P.

Metrology and Measurement Systems

|

2016

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vol. 23

|

issue 3

3

Voltage Dependence of Supercapacitor Capacitance

100%

Szewczyk A., Sikula J., Sedlakova V., Majzner J., Sedlak P., Kuparowitz T.

Metrology and Measurement Systems

|

2016

|

vol. 23

|

issue 3

4

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

100%

Grmela L., Sita Z., Sedlakova V., Majzner J., Sedlak P., Sikula J.

Metrology and Measurement Systems

|

2013

|

issue 4

5

Current Fluctuation Measurements of Amperometric Gas Sensors Constructed with Three Different Technology Procedures

84%

Sedlak P., Kubersky P., Skarvada P., Hamacek A., Sedlakova V., Majzner J., Nespurek S., Sikula J.

Metrology and Measurement Systems

|

2016

|

vol. 23

|

issue 4

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1 Hasse L.

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Ultrasonic Spectroscopy of Silicon Single Crystal

Supercapacitor Degradation Assesment by Power Cycling and Calendar Life Tests

Voltage Dependence of Supercapacitor Capacitance

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

Current Fluctuation Measurements of Amperometric Gas Sensors Constructed with Three Different Technology Procedures