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Thin Films Investigations by Means of Spin-Wave Resonance

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Maksymowicz A., Maksymowicz L., Whiting J.
Acta Physica Polonica A
|
1991
|
vol. 80
|
issue 5
665-673
EN
Magnetic resonance technique may successfully be applied to determine some basic parameters such as g-factor, magnetization M_{s} or anisotropy energy constant K_{u} in thin magnetic films. These parameters are obtained from a ferromagnetic resonance experiment when uniform precession of M_{s} takes place. From spin-wave resonance one may extract very valuable information on the exchange constant A or the surface conditions characterized by the surface anisotropy energy (or pinning parameters ρ). In fact, it is only spin-wave resonance or similar techniques which allow for measurements of A, ρ or the coupling constant K_{c} between ferromagnetic sublayers in multi-layered structure. The magnetic phase diagram, temperature dependence of the spin-waves stiffness constant, and the anisotropy energy constant may also be listed as less common examples of spin-wave resonance technique application for the investigation of thin films. This paper presents a theoretical approach to typical examples of experimental results and their interpretation from spin-wave resonance measurements.
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