Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.
X-ray diffraction, micro-Raman and the Fourier transform infrared spectroscopies as well as magnetometry measurements were performed on nanosized manganese oxides to probe their phase composition and magnetic properties. It was shown that the XRD method is less sensitive to phase composition of manganese oxide samples than spectroscopic methods. While in some samples the XRD method recognised only the manganosite MnO phase, the Raman and FT-IR methods revealed additionally the presence of the hausmannite Mn₃O₄ phase.
In this paper we present a utilization of anti-Stokes luminescence of Er-Yb systems for identifications of securities. A simple method of detection of an up-conversion phenomenon in such system by means of IR laser operating in the region 960-1010 nm is proposed.
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