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EN
In order to investigate the influence of the number of layers on the properties of ZrO₂ thin films, we prepared one pure ZrO₂ film sample with five layers and Ce, Eu, and Dy-doped ZrO₂ samples with single layer, by spin-coating sol gel-method. The crystal structures of thin films were determined using X-ray diffraction, morphology of the samples was analyzed by scanning electron microscopy, and the optical properties of the samples were determined by ultraviolet/visible absorbance measurements. The results of these measurements have shown that the concentration of the dopants and the thickness of thin film layers play a vital role in the physical, chemical, and optical properties of the pure and doped ZrO₂ thin films.
EN
Zirconium oxide (ZrO₂) is one of the widely studied oxide materials because of its excellent electrical, mechanical and optical properties. In this study, undoped and Dy-Eu-Ce co-doped ZrO₂ nanofibers were fabricated by electrospinning method and their crystal structure, surface morphology, optical properties, electrical and electronic properties, and chemical properties have been analyzed using X-ray diffraction, scanning electron microscope (SEM), UV/VIS spectrometer, four point probe technique (FPPT) energy dispersive X-ray (EDX) measurements, respectively.
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