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3 Metrology and Measurement Systems

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Semiconductor contact layer characterization in a context of hall effect measurements

100%

Kowalewski A., Wróbel J., Boguski J., Gorczyca K., Martyniuk P.

Metrology and Measurement Systems

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2019

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vol. 26

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issue 1

2

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Theoretical Simulation of a Room Temperature HgCdTe Long-Wave Detector for Fast Response − Operating Under Zero Bias Conditions

86%

Martyniuk P., Kopytko M., Madejczyk P., Henig A., Grodecki K., Gawron W., Rutkowski J.

Metrology and Measurement Systems

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2017

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vol. 24

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issue 4

3

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Fast Response Hot (111) HGCDTE MWIR Detectors

73%

Grodecki K., Martyniuk P., Kopytko M., Kowalewski A., Stępień D., Kębłowski A., Piotrowski A., Piotrowski J., Gawron W., Rogalski A.

Metrology and Measurement Systems

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2017

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vol. 24

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issue 3

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