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EN
Influence of annealing on hysteresis properties of the soft magnetic layer in Fe₂₀Ni₈₀/Tb₂₆Co₇₄ and Fe₂₀Ni₈₀/Ti/Tb₂₆Co₇₄ films with unidirectional anisotropy was investigated. Modification of the interface by introduction of the ultrathin Ti spacer was demonstrated to improve stability of coercivity and exchange bias field. According to our assumption, the Ti spacer can act as a barrier preventing a thermally-induced diffusion between the magnetic layers. In order to verify this point grazing incidence X-ray fluorescent analysis was used. Comparison of two sets of data attributed to the samples with and without Ti spacer at different stages of annealing revealed decrease of the angular shift between Co and Ni dependences even after annealing at 70°C for Fe₂₀Ni₈₀/Tb₂₆Co₇₄ and absent of any changes up to 300°C for the Fe₂₀Ni₈₀/Ti/Tb₂₆Co₇₄ film. These results can be interpreted as an evidence of the low-temperature interface modification in form of diffusion-like process in the samples without Ti spacer.
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vol. 126
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issue 6
1312-1314
EN
Influence of temperature on magnetization process was investigated in exchange coupled Tb_{26}Co_{74}/Co/Fe_{20}Ni_{80} films. Temperature dependences of exchange bias field and coercivity of the Fe_{20}Ni_{80} layer were obtained for films with various thicknesses of the Co spacer. The results obtained were interpreted in terms of changes of magnetic interface localization.
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