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EN
We propose a method for measuring the thickness of the exfoliated MoSe₂ layers deposited on Si/SiO₂ substrate, based on the reflectance measurements performed with laser light illumination at two different wavelengths: red and green from confocal microscope at room temperature. We demonstrate the correlation between the number of layers in a flake and the value of its relative reflection difference. We applied the transfer matrix method to calculate the reflectivity and verify our experimental results. The approach proposed by us allows for fast and automatic verification of the exfoliated MoSe₂ layers thickness on large areas of the substrate.
EN
Infrared and Raman investigations of two phases of bis(ethylenedithio)tetrathiafulvalene (BEDT-TTF) based organic conductors with the same CF3CF2SO3− anion: β′-(BEDT-TTF)2CF3CF2SO3 and δ′-(BEDT-TTF)2CF3CF2SO3, are shortly reviewed and compared with the most typical infrared properties of the family of (BEDT-TTF)2RR′SO3 organic conductors, where R = SF5, CF3, and R′ are CH2, CF2, CHF, CHFCF2, and CH2CF2. The role of the molecular structur and spatial organization of the counterions is discussed.
EN
In the present work, a CdTe alloy doped with a relatively high concentration of chromium (1%), and a CdTe:Cr layer, have been studied. Absorption and reflectivity spectra were measured at room temperature. They indicate the presence of chromium in the divalent state, both in the alloy and in the layer.
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