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Spoof Plasmons Affected by the Corrugated Structures

100%

Gric T.

Acta Physica Polonica A

2017

vol. 132

issue 4

1347-1350

As reported by Ritchie, the fundamental optical excitations that are confined to a metal/dielectric interface are referred as the surface plasmon polaritons. In the present study, we report on a theoretical investigation of the dispersion relation of surface plasmon polaritons on the periodically corrugated surfaces. Tunability of these structures can be enhanced further changing the employed material.

On the topographic and optical properties of SiC/SiO2 surfaces

64%

Jureckova S., Jureckova M., Chovanec F., Kobayashi H., Takahashi M., Mikula M., Pina E.

Open Physics

2009

vol. 7

issue 2

321-326

The roughness of the semiconductor surface substantially influences properties of the whole structure, especially when thin films are created. In our work 3C SiC, 4H SiC and Si/a-SiC:H/SiO2 structures treated by various oxidation a passivation procedures are studied by atomic force microscopy (AFM) and scanning tunnelling microscopy (STM). Surface roughness properties are studied by fractal geometry methods. The complexity of the analysed surface is sensitive to the oxidation and passivation steps and the proposed fractal complexity measure values enable quantification of the fine surface changes. We also determined the optical properties of oxidized and passivated samples by using visual modelling and stochastic optimization.

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1 Acta Physica Polonica A

1 Open Physics

1 2017

1 2009

1 Chovanec F.

1 Gric T.

1 Jureckova M.

1 Jureckova S.

1 Kobayashi H.

1 Mikula M.

1 Pina E.

1 Takahashi M.

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Spoof Plasmons Affected by the Corrugated Structures

On the topographic and optical properties of SiC/SiO2 surfaces