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X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

100%

Raoux D., Jaouen N., Tonnerre J. M., Bontempi E.

Acta Physica Polonica A

2000

vol. 98

issue 5

483-494

This paper reports on the use of a new technique to investigate the magnetic properties of thin films, multilayers and artificial structures, the X-ray resonant magnetic scattering at small values of the scattering vector. It can be used either by registering the reflectivity pattern or in a diffraction mode. In comparison with magneto-optical Kerr effect or neutron scattering, it offers an atomic selectivity due to the resonant excitation of a core electron, and even an electronic shell one. Examples are presented mainly in the soft X-range allowing to probe the 3d band of transition metals. They demonstrate the promising possibilities of the method to measure the magnetic moments carried by each of the atomic components in complex systems, as well as their distribution through thin layers, with an atomic resolution.

Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As

76%

Burian A., Lecante P., Mosset A., Galy J., Tonnerre J. M., Raoux D.

Acta Physica Polonica A

1994

vol. 86

issue 4

633-640

The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.

Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films

64%

Burian A., Jabłońska A., Burian A., Le Bolloc'h D., Metzger H., Proux O., Hazemann J., Mosset A., Raoux D.

Acta Physica Polonica A

2002

vol. 101

issue 5

701-708

The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In_{50}Se_{50} and Se-In and Se-Se correlations for In_{40}Se_{60} and In_{34}Se_{66} within the first coordination sphere.

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3 Acta Physica Polonica A

1 2002

1 2000

1 1994

3 Raoux D.

2 Burian A.

2 Mosset A.

2 Tonnerre J. M.

1 Bontempi E.

1 Galy J.

1 Hazemann J.

1 Jabłońska A.

1 Jaouen N.

1 Le Bolloc'h D.

1 Lecante P.

1 Metzger H.

1 Proux O.

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X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As

Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films