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Journals
3
Metrology and Measurement Systems
Years
2
2015
1
2014
Authors
3
Dziedzic A.
3
Stadler A. W.
3
Zawiślak Z.
2
Kolek A.
2
Nowak D.
1
Mleczko K.
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Full text local access
Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique
100%
Stadler A. W.
,
Kolek A.
,
Zawiślak Z.
,
Dziedzic A.
Metrology and Measurement Systems
|
2015
|
vol.
22
|
issue
4
2
Full text local access
NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE
100%
Stadler A. W.
,
Zawiślak Z.
,
Dziedzic A.
,
Nowak D.
Metrology and Measurement Systems
|
2014
|
issue
1
3
Full text local access
Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors
76%
Stadler A. W.
,
Kolek A.
,
Mleczko K.
,
Zawiślak Z.
,
Dziedzic A.
,
Nowak D.
Metrology and Measurement Systems
|
2015
|
vol.
22
|
issue
2
Page
/ 1
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