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EN
Polycrystalline manganese ditelluride (MnTe₂) thin films are synthesized on commercial glass substrates by chemical bath deposition technique at different pH values (pH = 9, 10, 11 and 12). The effect of pH on the structural and optical properties of chemically deposited MnTe₂ thin films have been investigated in this study. The structure and optical properties of the films are characterized by X-ray diffraction and optical absorption spectroscopy. The X-ray diffraction results suggest that the films are polycrystalline with a mixture of dominant cubic MnTe₂ phase and few traces of orthorhombic MnTeO₃ and MnTe₂O₅ phases. The optical band gap of the films increases approximately from 1.66 eV to 2.62 eV with increasing pH. Moreover, optical parameters of the films such as refractive index, extinction coefficient, real and imaginary dielectric constants are investigated using absorption and transmittance spectra taken from the UV-vis spectrophotometer. At 600 nm wavelength, refractive index and extinction coefficient values vary in the range of 1.39-1.55 and 0.17-0.23, respectively. An increase in optical band gap could be attributed to the quantum confinement effect.
EN
Indium sulfide (β-In₂S₃) thin films are synthesized by chemical bath deposition method using three different complexing agent volumes, triethanolamine (TEA) (0.30, 0.45, and 0.60 ml). The effect of complexing agent on the structural, morphological, optical and electrical properties of chemically deposited indium sulfide (β-In₂S₃) thin films have been investigated in this work. The characterization of the present films is carried out using X-ray diffraction, scanning electron microscopy, UV-vis spectroscopy and electrical measurements. The structure of the films is polycrystalline with a cubic phase of β-In₂S₃. Firstly, the band gap of the film decreases from 3.74 eV to 3.15 eV by adding 0.30 ml TEA. Then, it increases to 3.79 eV with increasing TEA. Nevertheless, previously, the refractive index of the films increases from 2.13 to 2.67 for the 0.30 mL TEA and then it decreases to the value of 2.11 with increasing TEA. Extinction coefficient, real and dielectric constant of the films are calculated using the absorption and transmittance spectra. Firstly, the electrical resistivity of the films decreases from 3.46×10⁸ Ω cm to 1.33×10⁷ Ω cm by adding 0.30 ml TEA. Then, it increases to the value of 2.16×10⁹ Ω cm with increasing TEA. Eventually, the more conductive film with worm-like morphology detected from the scanning electron microscopy is synthesized using 0.30 ml TEA. These results show that complexing agent has an important effect on the structural, morphological, optical and electrical properties of the deposited films.
EN
Cadmium selenide thin films with different pH values (pH = 10, 11, 12 and 13) are produced on glass substrates at 50°C for 3 h by chemical bath deposition technique. The structural, morphological and optical properties of the films are characterized by X-ray diffraction, scanning electron microscopy and optical absorption spectroscopy, respectively. The obtained films have hexagonal structure. The optical transparency of the films varies between 85% and 98% at wavelength of λ = 550 nm. The scanning electron microscopy studies show that the film deposited at pH = 10 exhibits the formation of nanorods in the width range from 1.8 μm to 10.9 μm and length range from 20.0 μm to 85.5 μm. The optical properties of the films are determined by measuring transmittance and absorbance characteristics which are used to find the optical band gap energy, refractive index, extinction coefficient and real dielectric constant. The band gap width of the films increases from 1.70 eV to 2.30 eV with increasing pH values. The refractive index of the film at pH = 10 is found as 1.54.
EN
Lead sulfide thin films are deposited on glass substrates at room temperature for 2 h by chemical bath deposition. The structure, surface morphology, optical and electrical properties of the thin films are characterized by X-ray diffraction, scanning electron microscopy, atomic force microscopy, optical absorption spectroscopy and the Hall effect measurements. The obtained films show the formation of well crystallized PbS with a cubic rock salt structure and with the preferential orientation (111) plane. The lattice parameter and crystallite size of the films are found as a=600 Å and 62 nm from the X-ray reflectivity data from the atomic force microscopy image, respectively. The band gap width of the films is determined as 2.84 eV. The optical parameters of the films such as refractive index, extinction coefficient, real and imaginary parts of dielectric constant are evaluated. Moreover, from the Hall measurements, electrical resistivity, conductivity carrier mobility, and carrier concentration of the films are determined as 3.722 Ω m, 0.268 Ω¯¹ m¯¹, 8.486× 10¯¹ m² V¯¹ s¯¹, and 1.976× 10^{18} m^{-3}, respectively.
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