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EN
The chemical composition of successive layers in a Co/Cu multilayered system was studied during growth with Auger electron spectroscopy. Experiments were carried out on a sample with 10 repetitions of Co(1 nm)/Cu(2 nm) evaporated at a very low deposition rate in ultrahigh vacuum. A very small amount of Bi or Pb (0.06 nm) was deposited on each Cu film in the system. The experimental data have shown that the concentration of Bi and Pb increases with the number of deposited trilayers up to coverage corresponding to 5 trilayers. At that point the concentration of the surfactant saturated. The changes in the surfactant concentrations are described with a simple model depicting the interaction of the surfactant atoms with the system and how the evolution of the segregation processes. It allows the prediction of the saturation concentration and helps to explain the behaviour of various elements used as a surfactant. The comparison between the theoretical predictions and the experimental results is also discussed.
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AFM, XRD and HRTEM Studies οf Annealed FePd Thin Films

39%
EN
Ferromagnetic FePd L 1_{0} ordered alloys are highly expected as forthcoming high-density recording materials, because they reveal a large perpendicular magnetocrystalline anisotropy [1]. The value of the magnetic anisotropy of FePd alloy strongly depends on the alloy composition, degree of alloy order as well as on the crystallographic grain orientation. In particular, to obtain the perpendicular anisotropy, it is necessary to get the films with (001) texture. One of the successful methods, which allows one to obtain highly ordered alloy, is a subsequent deposition of Fe and Pd layers, followed by an annealing at high temperature. This paper presents the study of the FePd thin alloy film structure changing in the result of high temperature annealing. During the annealing in high vacuum, the measurements of electrical resistance were performed, indicating the regions of different structure evolution. Changes in the crystal structure and surface morphology induced by thermal treatment were investigated by X-ray diffraction, atomic force microscopy, as well as high resolution transmission electron microscopy and then compared with electrical resistivity measurement. The slow thermal annealing of the deposited layers leads to the formation of L 1_{0} ordered FePd alloy with preferred (111) grain orientation. After the annealing at the highest used temperature, the dewetting process was observed, resulting in a creation of well oriented, regular nanoparticles.
EN
In this paper there are presented results of high resolution transmission electron microscope investigation concerning the structure of the Zn-Al-Si cast zinc alloy with Sr addition for crystal structure refinement after thermo-derivative analysis performed using the universal metallurgical simulator and analyzer platform. The thermo-derivative analysis allows to determine the specific points of the solidifying alloy, which is helpful for phase determination and proper heat treatment condition determination, allowing to reduce the energy costs and obtaining higher mechanical and functional properties. Using transmission electron microscopy, especially selected area diffraction method appliance it was possible to determine the phases occurring in the alloy in the state after chemical composition modification as well as after appliance of very precisely controlled cooling rate. The morphology and size of the microstructure of micro-sized eutectic was possible to determine as well the lattice parameters of the Zn α -phase. Particularly the overview will be also directed on the high resolution transmission electron microscope to achieve good insight into the structural changes on the atomic scale.
EN
Direct laser interference lithography is a new and low cost technique which can generate the line- or dot-like periodic patterns over large areas. In the present work, we report on direct fabrication of micrometer structures on Si surface. In the experiments the pulsed high power Nd:YAG laser operating at 1064 nm wavelength was used. Two-beam configuration with an angle of incidence of 40° was employed and different laser fluences up to 2.11 J/cm^2 were tested. Areas about 1 cm in diameter have been processed with a single pulse of 10 ns. The laser treated samples were analyzed by atomic force microscopy to investigate the surface topography and to measure the size and depth of the achieved structures. We observed periodic line-like arrays with grating period of the order of 1 μm.
EN
An optical strain sensor was developed for use in stretchable electronics. It consists of a diffraction grating formed directly on the examined surface illuminated by a laser beam which creates interference pattern. This pattern can then be used to determine axial and lateral strains for a uniaxial stress states. Direct laser interference patterning was employed as a fast processing tool for the preparation of micro- and sub-microgratings. Two coherent beams of Nd:YAG laser with 532 nm wavelength and pulse duration of 10 ns were used to selectively remove material from the irradiated sample surface. This technique creates periodic pattern on the metallized surface of polymeric substrates. New sensors formed by direct laser interference patterning method were able to resolve higher order diffraction maxima, which would be of benefit for strain measurement application. Experimental setup for tensile tests was composed of laser probe, the sensor element, and CCD camera. To extract strain values, we analysed acquired interference pattern images in real time software, developed with LabVIEW environment. This kind of contactless strain sensor is suitable for examination of stretchable electronics component for which conventional tensile tests are either not acceptable or can interfere with its normal operation.
EN
The [Co(1 nm)/Cu(2 nm)]_N multilayers with different numbers of bilayer repetitions (N=3 and 10) were thermally evaporated on Si(100) substrates with a small amount of Bi or Pb deposited only on the first and on the second Cu layer. The chemical composition of the surface after each step of the preparation process was studied by Auger electron spectroscopy. The evolution of the Auger peaks showed the segregation of Bi and Pb surfactants. During the evaporation of the subsequent Co and Cu layers, gradual decrease in the surfactant amount on the surface was observed. No appearance of Co peak on the Cu layer, and Cu peak on the Co layer even for a coverage of a few å indicates the layer continuity. The interface roughness of the surfactant-mediated Co/Cu layers analyzed by X-ray reflectometry (when surfactant was deposited twice) was similar to the pure Co/Cu samples. However, more repetitions of surfactant, by reduction of interface roughness, improve the layer quality.
11
33%
EN
The atomic environment of Bi atoms in the Co/Cu multilayered system was studied with X-ray absorption fine structure spectroscopy. Experiments were carried out on a Co(1 nm)/Cu(2 nm) system with 5 and 10 repetitions of Co/Cu evaporated with very low deposition rate in ultrahigh vacuum. A very small amount of Bi (0.06 nm) was deposited on each Cu film in the system. The X-ray absorption fine structure spectra were measured at the BiL_3 edge in the X-ray absorption near-edge structure and extended X-ray absorption fine structure ranges at the Beamline X1 of HASYLAB/DESY synchrotron laboratory in Hamburg. The experimental data showed different local neighbourhood of Bi, depending on the number of Co/Cu bilayer repetitions. The results are discussed in terms of the location and segregation of the Bi atoms as well as its possible oxidation ways.
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