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EN
A brief review of the main experimental techniques exploiting syn­chrotron radiation in semiconductor physics is attempted. Topics empha­sized include the study of surface and interface phenomena, such as sur­face structural properties (e.g. surface reconstruction) by X-ray diffraction, surface dynamical properties (e.g. adsorbate vibrational amplitudes) by the X-ray standing waves technique, etc. This review emphasizes brilliance (the phase-space density of photons) as the main figure of merit for many ex­perimental techniques applicable to research in semiconductor physics. Ex­amples of experiments made possible by the so-called "third generation", high-brilliance synchrotron sources are presented.
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