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Molecular dynamics computer simulations are employed to investigate the effect of a sample thickness on the ejection process from ultrathin graphite. The thickness of graphite varies from 2 to 16 graphene layers and the system is bombarded by 10 keV C₆₀ projectiles at normal incidence. The ejection yield and the kinetic energy of emitted atoms are monitored. The implications of the results to a novel analytical approach in secondary ion mass spectrometry based on the ultrathin free-standing graphene substrates and transmission geometry are discussed.
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