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Micro-Raman Study of BiFeO_3 Thin Films Fabricated by Chemical Solution Deposition Using Different Bi/Fe Ratio Precursors

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Nakamura T., Fukumura H., Hasuike N., Harima H., Nakamura Y., Kisoda K., Nakashima S., Okuyama M.
Acta Physica Polonica A
|
2009
|
vol. 116
|
issue 1
72-74
EN
BiFeO_3 thin films were grown by chemical solution deposition using precursors with different elemental ratios, Bi/Fe = 1.1/1.0, 1.0/1.0 and 1.0/1.1. All the samples consisted of two easily distinguishable components of crystalline and amorphous phases. We have found that the electric properties of BiFeO_3 thin films are closely connected to the crystallinity of the films.
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