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X-Ray Standing Waves: a Powerful Tool for Interface Studies

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Lagomarsino S., Scarinci F., Castrucci P., Giannini C.
Acta Physica Polonica A
|
1994
|
vol. 86
|
issue 4
553-566
EN
The X-ray standing wave technique has demonstrated in these last years to be a powerful method in the study of interfaces. In this paper the fundamentals of the technique will be given, together with examples of applications in the field of metal-semiconductor, of buried semiconductor-semiconductor interfaces and in structural studies of Langmuir-Blodgett films.
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