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1

Study of Magnetic Micro-Ellipses by Cantilever Sensor

100%

Sečianska K., Šoltýs J., Cambel V.

Acta Physica Polonica A

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2017

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vol. 131

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issue 4

833-835

EN

In this paper, we propose a method for prototyping cantilever sensors by means of a modification of commercial atomic force microscopy cantilevers, using electron beam lithography and focused ion beam milling. To overcome obstacles with resist coating related to spin-coating of nonplanar 3D substrates, in this case of free-standing cantilevers, we propose a modified method based on spin-coating technique. An auxiliary atomic force microscopy chip was inserted below the cantilever to quasi-planarize the surface during spin-coating of electron beam resist. Magnetic micro-ellipses were prepared at the free-end of the cantilever by electron beam lithography. We propose a design of a cantilever sensor for the study of magnetic coupling between two cantilevers, prepared by focused ion beam milling. In ideal case, the coupling could be detected by a shift in resonance peaks. Attractive and repulsive forces between magnetic structures were shown by magnetic force microscopy.

2

Study of Tip-Induced Ti-Film Oxidation in Atomic Force Microscopy Contact and Non-Contact Mode

100%

Šoltýs J., Cambel V., Fedor J.

Acta Physica Polonica A

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2003

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vol. 103

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issue 6

553-558

EN

Local anodic oxidation of metals using scanning probe techniques is mostly used for fabrication of isolated gates. The high-resistance oxide created in such a manner divides a thin metallic film into isolated regions. The tip-induced metallic oxide has not so far been used in nanolithography processes as a masking material. The aim of this contribution is to study the technological potential of a TiO_x mask prepared by the local anodic oxidation of a Ti film. Such a mask can be used to complete a nanotechnology process using atomic force microscopy, which can be easily combined with standard optical lithography techniques. We have found that the insulating properties of the oxides prepared in contact and non-contact modes differ strongly - they represent an energy barrier of 200 meV and 400 meV, respectively.

3

High Resolution Tips for Switching Magnetization MFM

88%

Precner M., Fedor J., Tóbik J., Šoltýs J., Cambel V.

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vol. 126

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issue 1

386-387

EN

Switching magnetization magnetic force microscopy (SM-MFM) is based on two-pass magnetic force microscopy with opposite orientation of tip magnetization between two scans. The sum of the scanned data with reversed tip magnetization depicts local van der Waals forces, and their difference maps the local magnetic forces. Tip magnetization can be easily reversed in external magnetic field during the scanning. The separation of the forces mapped enables scanning in close proximity of the sample (~5 nm). Therefore, extremely high spatial resolution (10 nm) is achievable by the SM-MFM. Image phase resolution of the MFM method depends on various geometric parameters of the tip, such as tip length, its apex radius and taper angle. The parameters are determined by the evaporation process, within which the standard atomic force microscopy tips are coated with magnetic layer. In this work we show that the thickness of the coated layer is important for the SM-MFM spatial resolution.

4

Magnetization Studies of Cu_{0.058}TiSe_{2} Near a Quantum Critical Point

88%

Husaníková P., Cambel V., Fedor J., Šoltýs J., Karapetrov G.

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vol. 126

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issue 1

336-337

EN

We study superconducting properties of highly underdoped Cu_{0.058}TiSe_{2} single crystal by means of bulk magnetization measurements. We extract the upper critical field, H_{c2}, for magnetic field applied parallel, as well as perpendicular to the sample planes. Obtained values, H^{ab}_{c2}(0)=1.03 T and H^c_{c2}(0)=0.54 T, define a moderate anisotropy of the upper critical fields of 1.90. From the upper and lower critical fields we extract the Ginzburg-Landau parameters κ_{ab}(0)=26.3, and κ_c(0)=12.6 that classify Cu_{0.058}TiSe_{2} as an extreme type II superconductor.

5

Vortex Dynamics in Ferromagnetic Nanoelements Observed by Micro-Hall Probes

64%

Ščepka T., Šoltýs J., Precner M., Fedor J., Tóbik J., Gregušová D., Gucmann F., Kúdela R., Cambel V.

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vol. 126

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issue 1

390-391

EN

In this work we measure the nucleation and annihilation of magnetic vortices in Pacman-like (PL) micromagnets prepared from Permalloy (Ni_{81}Fe_{19}, Py) at 77 K. Lateral dimensions of explored objects are ≤1 μm with thickness of about 40 nm. The micromagnets are located directly on the high-sensitive micro-Hall probe based on GaAs/AlGaAs heterostructure by lift-off process. Experiments show good agreement of the magnetization reversal with the micromagnetic simulation. Other shapes of micromagnets are also considered to obtain more precise picture of the vortex dynamics.

6

Local Magnetometry of Cu_{0.064}TiSe_{2}

64%

Pribulová Z., Medvecká Z., Kačmarčík J., Komanický V., Klein T., Husaníková P., Cambel V., Šoltýs J., Karapetrov G., Samuely P.

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vol. 126

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issue 1

370-371

EN

Local magnetometry using miniature Hall-probe array was used to study vortex distribution in superconducting single crystal of Cu_{x}TiSe_{2}, with x=0.064 and T_{c}=3.2 K. We show that vortices after penetration into the sample move towards the center, resulting into a dome-shape field profile. Such a profile is a signature of relatively low pinning. We show that these measured profiles are consistent with a model proposed for the samples in the absence of bulk pinning. Modifications necessary to obtain quantitative agreement between the model and the data are presented.

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6 Acta Physica Polonica A

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2 Karapetrov G.

2 Precner M.

2 Tóbik J.

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1 Gucmann F.

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1 Samuely P.

1 Sečianska K.

1 Ščepka T.

Study of Magnetic Micro-Ellipses by Cantilever Sensor

Study of Tip-Induced Ti-Film Oxidation in Atomic Force Microscopy Contact and Non-Contact Mode

High Resolution Tips for Switching Magnetization MFM

Magnetization Studies of Cu_{0.058}TiSe_{2} Near a Quantum Critical Point

Vortex Dynamics in Ferromagnetic Nanoelements Observed by Micro-Hall Probes

Local Magnetometry of Cu_{0.064}TiSe_{2}