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EN
The present work is devoted to investigation of optical absorption changes in Fe and Cu doped LiNbO₃ (LNO) single crystals induced during annealing in vacuum and air as well as under influence of the ²⁰⁹Bi ions irradiation with energy 11.4 MeV/u (MeV per nucleon) and a fluence 5×10¹¹ cm¯² at room temperature. The analysis of changes of absorption of the crystal during air annealing have been studied in the Arrhenius coordinates and activation energies have been determined.
EN
In this work electron magnetic resonance (EMR) spectra of off-stoichiometric Ni_{50}Mn_{35.5}In_{14.5} Heusler alloy ribbons obtained by melt-spinning method were measured. The EMR measurements were performed on the X-band (9.36 GHz) spectrometer. Angle dependences were registered for three orientations of sample, with the use of uniaxial goniometer at 300. The results exhibited magnetic anisotropy and were used for calculating the principal values of g tensor.
EN
The crystal structure of CrTe suggests two-dimensional magnetism in the plane perpendicular to the c axis. It is consistent with the temperature dependence of the g factor and EPR lines width observed. In the present paper we investigate the CrTe alloy which has been prepared by melting of the powdered Cr₂Te₃ in evacuated quartz ampoule at the temperature 1600 K. ESR spectra were recorded using X-band (9.4 GHz) spectrometer provided with gas nitrogen cryostat. The shape of the EPR line depends strongly on the temperature. In the vicinity of the room temperature the lines become very wide and weak or disappear completely. At lower temperatures the shape of the lines approaches the Dyson function. The asymmetry of lines is attributed to the strong exchange interactions as well as to the semimetal electrical conductivity. Above the room temperature the shape of spectra is characteristic for the paramagnetic phase. Results were addressed based on the model of critical spin fluctuations in two-dimensional Heisenberg magnet proposed by Eremin et al.
EN
We have studied magnetic properties of zinc-oxide composite doped with high concentration (up to 20%) of Co and Cr ions. The pulsed laser deposition method was used to obtain samples on quartz glass and sapphire substrates. Samples were annealed at 100-250°C for ZnO on quartz substrate, and 300-700°C on sapphire substrate. EMR measurements were carried out and temperature dependence of the EMR spectra was obtained. The angular dependence in two samples orientation, vertical and horizontal, were also obtained. Analysis of the temperature dependences of the integral intensity of EMR spectra was carried out using the Curie-Weiss law.
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EN
The EPR studies of CdTe:Cr were performed on X-band (9.6 GHz) spectrometer at room temperature. Single CdTe crystals were doped by chromium Cr in the synthesis process. The spectra observed were resolved into two spectra. The first one consisted of very broad line (Δ B=100 mT) and the second one showed a typical fine structure. The complete angular dependence measurements were obtained. The fine structure of Cr^{2+} or Cr^{3+} ions was assumed and simulated. It follows from the theoretical analysis of the obtained spectra that degree of ionization of the chromium Cr dopant is 3+.
EN
We study CdTe:Cr single crystals grown by the physical vapor transport method from pre-synthesized (Cd,Cr)Te alloys with 5 at.% of chromium nominal content. Macrodefects in the form of (111)-oriented thin platelets of dopant-related second phases were detected by scanning electron microscopy patterning of the chemically treated surfaces of the crystals. Magnetic properties of the crystals were investigated by ferromagnetic resonance using X-band Bruker spectrometer (9.43 GHz). Their ferromagnetic resonance spectra show several broad lines, which position depends on the orientation of the sample in relation to the external magnetic field in spectrometer. The angular dependences of ferromagnetic resonance spectra are interpreted in the frame of shape anisotropy of ferromagnetic resonance of the planar defects embedded in a weak magnetic CdTe matrix.
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