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Journals
4
Metrology and Measurement Systems
Years
1
2017
2
2013
1
2012
Authors
4
Grmela L.
2
Sedlakova V.
2
Sikula J.
2
Šik O.
1
Andreev A.
1
Knápek A.
1
Kuparowitz M.
1
Majzner J.
1
Sedlak P.
1
Sita Z.
1
Šikula J.
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Full text local access
Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise
100%
Grmela L.
,
Šik O.
,
Andreev A.
,
Sikula J.
Metrology and Measurement Systems
|
2013
|
issue
3
2
Full text local access
Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors
100%
Kuparowitz M.
,
Grmela L.
,
Sedlakova V.
Metrology and Measurement Systems
|
2017
|
vol.
24
|
issue
2
3
Full text local access
Cold Field-Emission Cathode Noise Analysis
100%
Knápek A.
,
Grmela L.
,
Šikula J.
,
Šik O.
Metrology and Measurement Systems
|
2012
|
issue
2
4
Full text local access
Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors
76%
Grmela L.
,
Sita Z.
,
Sedlakova V.
,
Majzner J.
,
Sedlak P.
,
Sikula J.
Metrology and Measurement Systems
|
2013
|
issue
4
Page
/ 1
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