Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl
Preferences help
Polish version English version Language
enabled [disable] Abstract
Number of results

Results found: 6

Number of results on page
first rewind previous Page / 1 next fast forward last

Search results

help Sort By:

help Limit search:
first rewind previous Page / 1 next fast forward last
1
Content available remote

Elemental Composition, Topography and Wettability of Pb_{x}Sn_{1 - x}S Thin Films

100%
Tashlykov I., Turavets A., Gremenok V., Żukowski P.
|
|
vol. 125
|
issue 6
1339-1344
EN
PbSnS thin films were prepared by hot-wall vacuum evaporation. The Rutherford backscattering technique was employed for the investigation of Pb_{x}Sn_{1 - x}S thin films composition. With a help of atomic force microscopy the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on Pb_{x}Sn_{1 - x}S thin films have been conducted on our original setup.
2
Content available remote

Surface Properties of Me/Si Structures Prepared by Means of Self-Ion Assisted Deposition

100%
Tashlykov I., Żukowski P., Mikhalkovich O., Baraishuk S.
|
|
vol. 125
|
issue 6
1306-1309
EN
In this paper a composite structure, topography, wettability and nanohardness of a (100) Si surface modified by means of ion-assisted deposition of metal (Me) coatings in conditions of a self-irradiation are discussed.
3
Content available remote

Surface Morphological Properties of Mo-Based Thin Films on Glass

100%
Tashlykov I., Turavets A., Zukowski P.
Acta Physica Polonica A
|
2013
|
vol. 123
|
issue 5
840-842
EN
In that report we observe the initial stages in the process of film growth at different irradiation doses. Investigations of influence of Mo deposition on glass substrates by means of self-ion-assisted deposition on its topography (atomic force microscopy) and wettability (sessile-drop method) were carried out. It was found out that with an increase of the irradiation dose, the average roughness and the contact angle increases rapidly at first and then decrease. 2.45-2.77 increase in the contact angle of water when Mo-based coating was deposited on the glass was observed.
4
Content available remote

Influence of Xe^{+} Irradiation on Topography and Wettability of Graphite Surface

100%
Tashlykov I., Turavets A., Zhukowski P.
Acta Physica Polonica A
|
2011
|
vol. 120
|
issue 1
115-117
EN
The investigation of influence of Xe^{+} ions irradiation of graphite on its surface topography and wettability was conducted. With the increase of the irradiation dose, the roughness average increases rapidly at first (when the sample was irradiated at the dose of 1 × 10^{14} cm^{-2}) and then decreases slowly. The atomic force microscopy three-dimensional pictures showed that after irradiation of graphite of Xe^{+} ions with a dose of 3 × 10^{15} cm^{-2} hemispherical grains (from 0.2 to 0.8 μm in diameter) appear on its surface. Surface water contact angle measurement showed that irradiation of graphite by Xe^{+} ions leads to a hydrophobic surface of graphite. We have observed that irradiation of graphite by Xe^{+} ions can be used for obtaining graphite surface with desirable topography and water wettability.
5
Content available remote

Surface Composition of CIS Compound Affected by Xe⁺ Irradiation

100%
Tashlykov I., Zukowski P., Silvanovich D., Gremenok V.
Acta Physica Polonica A
|
2015
|
vol. 128
|
issue 5
927-930
EN
The paper presents the results of investigation of element composition of CuInSe₂ (CIS) compounds obtained by vertical Bridgman technique and on a glass substrate by the thermal deposition of Cu-In thin films with the subsequent annealing in selenium vapour. The depth profile distribution of elements in these samples using the Rutherford backscattering spectrometry/channeling technique in conjunction with the RUMP code simulation is also discussed.
6
Content available remote

Self-Ion Assisted Modification of Elastomer and Its Micro- and Macroscopic Properties

100%
Kasperovich A., Luhin V., Tashlykov I., Żukowski P.
|
|
vol. 125
|
issue 6
1421-1424
EN
The composition of Zr-based thin films on rubber was investigated by utilizing the Rutherford backscattering technique and RUMP code simulation. The level of adhesion between the coating fabricated on rubber by means of self-ion assisted deposition was measured using Pin Pull Test. The coating deposited on the rubber consists of Zr, O, C, H. The self-ion assisted deposition process may successfully control the level of adhesion of the coating to the rubber and causes strong modification of the macroscopic properties of the rubber surface.
first rewind previous Page / 1 next fast forward last
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.