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Point-Contact I-V Characteristics of the Electroluminescent ZnS:Mn,Cu Thin Films Studied by STM

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Szuba S., Czajka R., Gordon W., Polewska W., Raułuszkiewicz J., Reich A.
Acta Physica Polonica A
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1991
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vol. 79
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issue 2-3
171-174
EN
STM images of ZnS:Mn,Cu thin films and spatially resolved current-voltage characteristics are shown. The results make possible to estimate the morphology and conductivity distribution with nanometer resolution.
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STM/AFM Observations of Co/Cu Magnetic Multilayers

100%
Aleszkiewicz M., Kalinowski R., Czajka R., Polewska W., Wawro A., Baczewski L. T., Raułuszkiewicz J.
Acta Physica Polonica A
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1997
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vol. 91
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issue 2
311-314
EN
UHV deposited magnetic Co/Cu multilayers were investigated by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Surface of the sample i.e. upper covering layer in "plane" configuration and individual sublayers in "cross-section" configuration were investigated. A possibility of structure characterization of metallic multilayers by STM and AFM in the cross-section configuration is demonstrated.
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