The negative differential resistance phenomenon evident on current-voltage (I-V) characteristics for Al-plasma-polymerized polystyrene-Al system is described by means of the Schottky-like barrier model constructed directly from the simplified electronic band structure of an insulator.
A qualitative discussion of the simple interface barrier defect-type model (Bardeen-like) trying to explain the metal-polymer-vacuum interface formation in the high static electric field (field emission microscopy) is presented.
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