Optical absorption and reflectivity spectra of highly chromium doped CdTe alloy and layer

• Authors: Piotr Potera , Ireneusz Stefaniuk , Marian Kuzma , Ihor Virt , Barbara Pukowska
• Languages of publication: EN

Abstracts

EN

In the present work, a CdTe alloy doped with a relatively high concentration of chromium (1%), and a CdTe:Cr layer, have been studied. Absorption and reflectivity spectra were measured at room temperature. They indicate the presence of chromium in the divalent state, both in the alloy and in the layer.

Keywords

EN

cadmium telluride; layers; optical properties; chromium ions

Discipline

• 78.55.Et: II-VI semiconductors
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 78.40.-q: Absorption and reflection spectra: visible and ultraviolet(for infrared spectra, see 78.30.-j; for optical spectra of superconductors, see 74.25.nd; for time resolved reflection spectroscopy, see 78.47.jg; for multiphoton absorption, see 79.20.Ws in impact phenomena)
• 78.30.-j: Infrared and Raman spectra(for vibrational states in crystals and disordered systems, see 63.20.-e and 63.50.-x, respectively; for Raman spectra of superconductors, see 74.25.nd)

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2009
• Volume: 7
• Issue: 2
• Pages: 299-303

Dates

published

1 - 6 - 2009

online

26 - 4 - 2009

Contributors

author

Piotr Potera

• Institute of Physics, University of Rzeszow, Rejtana 16 A Str., 35-959, Rzeszow, Poland

author

Ireneusz Stefaniuk

• Institute of Physics, University of Rzeszow, Rejtana 16 A Str., 35-959, Rzeszow, Poland

author

Marian Kuzma

• Institute of Physics, University of Rzeszow, Rejtana 16 A Str., 35-959, Rzeszow, Poland

author

Ihor Virt

author

Barbara Pukowska

• Institute of Physics, Jagiellonian University, Reymonta 4 Str., 30-059, Kraków, Poland

References

• [1] T. J. Carrig, IEEE J. Quantum Elect. 31, 759 (2002)
• [2] A. V. Podlipensky et al., Opt. Commun. 192, 65 (2001) http://dx.doi.org/10.1016/S0030-4018(01)01025-2[Crossref]
• [3] R. H. Page et al., IEEE J. Quantum Elect. 33, 609 (1997) http://dx.doi.org/10.1109/3.563390[Crossref]
• [4] I. T. Sorokina, Opt. Mater. 26, 395 (2004) http://dx.doi.org/10.1016/j.optmat.2003.12.025[Crossref]
• [5] A. G. Bluiett, U. Hömmerich, R. T. Shah, S. B. Trivedi, J. Electron. Mater. 31, 806 (2002) http://dx.doi.org/10.1007/s11664-002-0241-1[Crossref]
• [6] G. W. Ludwig, M. R. Lorenz, Phys. Rev. 131, 601 (1963) http://dx.doi.org/10.1103/PhysRev.131.601[Crossref]
• [7] M. Z. Cieplak, M. Godlewski, J. M. Baranowski, Phys. Status Solidi B 70, 323 (1975) http://dx.doi.org/10.1002/pssb.2220700133[Crossref]
• [8] H. Hömmerich, A. G. Bluiett, E. Nyein, S. B. Trivedi, R. T. Shah, Mater. Res. Soc. Symp. Proc. 864, E4.19.1 (2005)
• [9] I. Stefaniuk, M. Bester, I. E. Lipiñski, J. Physics: Conference Series - Symmetry and Structural Properties of Condensed Matter (SSPCM 2005) 30, 339 (2006)
• [10] B. Chrisey, G. K. Hubler, Pulsed Laser Deposition of Thin Films (J. Wiley and Sons. Inc., New York, 1994)
• [11] I. Stefaniuk, W. Obermayr, J. Magn. Reson. (in press)
• [12] I. Stefaniuk, M. Bester, M. Kuzma J. Physics: Conference Series - Symmetry and Structural Properties of Condensed Matter (SSPCM 2007) 104, 012010 (2008)
• [13] M. Cardona, D. Greenaway, Phys. Rev. 131, 98 (1963) http://dx.doi.org/10.1103/PhysRev.131.98[Crossref]
• [14] I. Freeouf, Phys. Rev. B 7, 3810 (1973) http://dx.doi.org/10.1103/PhysRevB.7.3810[Crossref]
• [15] A. Bylica et al., Thin Solid Films 439, 511 (2006)
• [16] J. Dijkstra, H. H. Weitering, van C. F. Bruggen, C. Haas, de R. A. Groot, J. Phys. Condens.-Mat. 1, 9141 (1989) http://dx.doi.org/10.1088/0953-8984/1/46/008[Crossref]
• [17] W. S. Enloe et al., J. Appl. Phys. 61, 2005 (1987) http://dx.doi.org/10.1063/1.337996[Crossref]
• [18] D. Chadi, I. Walter, M. Cohen, Y. Petroff, M. Balkanski, Phys. Rev. B 5, 3058 (1972) http://dx.doi.org/10.1103/PhysRevB.5.3058[Crossref]
• [19] U. Hommerich, I. K. Jones, Ei Nyein, S. B. Trivedi, J. Cryst. Growth 287, 450 (2006) http://dx.doi.org/10.1016/j.jcrysgro.2005.11.064[Crossref]
• [20] D. Marple, Phys. Rev. 150, 728 (1966) http://dx.doi.org/10.1103/PhysRev.150.728[Crossref]

Identifiers

DOI

10.2478/s11534-008-0161-7