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Publisher
Institute of Physics, Polish Academy of Sciences
Journal
Acta Physica Polonica A
Year
2002
Volume
101
Issue
5
Identifiers
Cover
Volume contents
5
article:
Novel Sources for Synchrotron Light
(
Weckert E.
), p. 565-581
article:
Complementarity of Neutron and Ultrahigh Resolution Synchrotron X-Ray Protein Crystallography Studies: Results with Concanavalin A at Cryo and Room Temperature
(
Helliwell J.
,
Price H.
,
Deacon A.
,
Raftery J.
,
Habash J.
), p. 583-588
article:
Design of the 08ID-1 Protein Crystallography Beamline at the Canadian Light Source
(
Grochulski P.
,
Blomqvist I.
,
Yates B.
,
Hallin E.
,
Delbaere L.
), p. 589-594
article:
Design of a 5-Station Macromolecular Crystallography Beamline at MAX-Lab
(
Mammen C.
,
Ursby T.
,
Cerenius Y.
,
Thunnissen M.
,
Als-Nielsen J.
,
Larsen S.
,
Liljas A.
), p. 595-602
article:
Soft X-Ray Diffraction up to Wavelengths of 6.0Å Becomes Feasible at ID1 of ESRF
(
Carpentier P.
,
Boesecke P.
,
Bois J.
,
Chesne M.
,
Fanchon E.
,
Kahn R.
,
Stuhrmann H.
,
Vicat J.
), p. 603-612
article:
Automatic System for Crystallographic Data Collection and Analysis
(
Minor W.
,
Cymborowski M.
,
Otwinowski Z.
), p. 613-619
article:
X-ray Holography with a Position Sensitive Detector
(
Lausi A.
,
Kopecky M.
,
Busetto E.
,
Savoia A.
), p. 621-628
article:
Prototype Silicon Position-Sensitive Detector Working with Bragg-Brentano Powder Diffractometer
(
Zięba A.
,
Dąbrowski W.
,
Gryboś P.
,
Powroźnik W.
,
Stobiecki T.
,
Świentek K.
,
Słowik J.
,
Wiącek P.
), p. 629-634
article:
Structural Genomics in Europe and beyond - Shifting Scientific Directions at EMBL Hamburg
(
Wilmanns M.
), p. 635-646
article:
Small Angle X-Rays Scattering Studies of Biomolecules
(
Funari S.
), p. 647-658
article:
Mutant HIV-1 Protease Complexed with Tetrapeptide Inhibitor. Preliminary Report
(
Skálová T.
,
Hašek J.
,
Dohnálek J.
,
Petroková H.
,
Buchtelová E.
), p. 659-663
article:
Structural Characterization of Carane Derivative Stereoisomers - Potent Local Anesthetics
(
Grochowski J.
,
Serda P.
,
Pasenkiewicz-Gierula M.
,
Czarnecki R.
,
Librowski T.
,
Lochyński S.
,
Frąckowiak B.
), p. 665-674
article:
Phase Transformations in Binary Alloys under High Pressure
(
Degtyareva V.
), p. 675-688
article:
X-ray Study of Strain Relaxation in Heteroepitaxial AlGaAs Layers Annealed under High Hydrostatic Pressure
(
Bąk-Misiuk J.
,
Adamczewska J.
,
Misiuk A.
,
Regiński K.
,
Wierzchowski W.
,
Wieteska K.
,
Kozanecki A.
,
Kuritsyn D.
,
Glukhanyuk W.
,
Trela J.
), p. 689-699
article:
Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films
(
Burian A.
,
Jabłońska A.
,
Burian A.
,
Le Bolloc'h D.
,
Metzger H.
,
Proux O.
,
Hazemann J.
,
Mosset A.
,
Raoux D.
), p. 701-708
article:
X-Ray Absorption Studies of Ge Layers Buried in Silicon Crystal
(
Demchenko I.
,
Ławniczak-Jabłońska K.
,
Zhuravlev K.
,
Piskorska E.
,
Nikiforov A.
,
Welter E.
), p. 709-717
article:
Oxygen Precipitation in Si:O Annealed under High Hydrostatic Pressure
(
Misiuk A.
,
Bąk-Misiuk J.
,
Bryja L.
,
Kątcki J.
,
Ratajczak J.
,
Jun J.
,
Surma B.
), p. 719-727
article:
Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge
(
Wieteska K.
,
Wierzchowski W.
,
Graeff W.
,
Lefeld-Sosnowska M.
,
Regulska M.
), p. 729-734
article:
Solubility and Segregation of Co in CdTe-Based Ternary and Quaternary Alloys
(
Miotkowska S.
,
Dynowska E.
,
Miotkowski I.
,
Alawadhi H.
,
Lewicki A.
,
Metcalf P.
,
Ramdas A.
), p. 735-742
article:
Fine Diffraction Effects in Si Single Crystals Implanted with Fast Ar Ions and Annealed
(
Żymierska D.
,
Godwod K.
,
Adamczewska J.
,
Auleytner J.
,
Choiński J.
,
Regiński K.
), p. 743-750
article:
Curved Surfaces in Disordered Carbons by High Energy X-ray Scattering
(
Burian A.
,
Szczygielska A.
,
Kołoczek J.
,
Dore J.
,
Honkimaki V.
,
Duber S.
), p. 751-759
article:
Nanostructure and Thermal Behaviour of Liquid Crystalline Oligoester
(
Janicki J.
), p. 761-766
article:
Klein-Gordon Formulation of X-ray Diffraction in the Laue Cas
(
Borowski J.
), p. 767-780
article:
Lattice Parameters of Aluminium Nitride in the Range 10-291 K
(
Paszkowicz W.
,
Knapp M.
,
Podsiadło S.
,
Kamler G.
,
Pełka J.
), p. 781-785
article:
X-ray Characterization of Films Formed by Pulsed Laser Deposition on Cold Substrates from YBaCuO Targets
(
Pełka J.
,
Paszkowicz W.
,
Gierłowski P.
,
Lewandowski S.
,
Zieliński M.
,
Barbanera S.
,
Knapp M.
), p. 787-794
article:
Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods
(
Klinger D.
,
Lefeld-Sosnowska M.
,
Pełka J.
,
Paszkowicz W.
,
Gierłowski P.
,
Pankowski P.
), p. 795-801
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