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Publisher
Institute of Physics, Polish Academy of Sciences
Journal
Acta Physica Polonica A
Year
1998
Volume
93
Issue
2
Identifiers
Cover
Volume contents
2
article:
1st International Symposium Scanning Probe Spectroscopy and Related Methods. Preface/
, p. 255-258
article:
Spatially Resolved Chemistry on Bimetallic Surfaces
(
Behm R.
), p. 259-272
article:
Surface State of Gd(0001) Films on W(110): Scanning Tunneling Spectroscopy Study
(
Bode M.
,
Pascal R.
,
Getzlaff M.
,
Wiesendanger R.
), p. 273-280
article:
A Theoretical Analysis of Ballistic Electron Emission Microscopy: Band Structure Effects and Attenuation Lengths
(
de Andres P.
,
Reuter K.
,
Garcia-Vidal F.
,
Flores F.
,
Hohenester U.
,
Kocevar P.
), p. 281-287
article:
Scanning Tunneling Microscopy of Ordered Organic Monolayer Films on Si(001)
(
Hamers R.
,
Hovis J.
,
Liu H.
), p. 289-295
article:
Electronic Phase Transition in Layered Materials 1T-TaS_{x}Se_{2-x} Probed by Cryogenic STM/STS
(
Hasegawa T.
,
Shiino O.
,
Yamaguchi W.
,
Endo T.
,
Sugawara H.
,
Kitazawa K.
), p. 297-305
article:
Influence of Atomic and Electronic Structure of a Tip on Stm Images
(
Jurczyszyn L.
,
Mingo N.
,
Flores F.
), p. 307-315
article:
Chemical Reactions and Electronic Functions of Carbon Cluster Arrays Studied by Scanning Tunneling Spectroscopy and High-resolution Electron Energy Loss Spectroscopy
(
Kasuya A.
,
Hu C.
,
Suto S.
,
Tohji K.
,
Takahashi H.
,
Czajka R.
,
Wawro A.
,
Nishina Y.
), p. 317-322
article:
Applications of Scanning Tunneling Microscopy To Solid State Physics
(
van Kempen H.
,
Boon E.
,
van der Wielen M.
,
Wildöer J.
,
Prins M.
,
Jansen R.
,
Schad R.
), p. 323-331
article:
Scanning Probe Microscopy and Spectroscopy of High Temperature Superconductors
(
de Lozanne A.
,
Edwards H.
,
Yuan C.
,
Markert J.
), p. 333-342
article:
Numerical Modelling of Adsorption of Metallic Particles on Graphite Substrate Via Molecular Dynamics Simulation
(
Rafii-Tabar H.
), p. 343-354
article:
Tunneling and Point Contact Spectroscopy of High-T_{c} Superconducting Thin Films
(
Seidel P.
,
Grajcar M.
,
Plecenik A.
), p. 355-363
article:
Some Applications of Ballistic Electron Emission Microscopy/Spectroscopy
(
Walachová J.
), p. 365-372
article:
Atomic Force Microscopy of Instabilities and Reorganization of Langmuir-Blodgett Films
(
Takamoto D.
,
Ter-Ovanesyan E.
,
Schwartz D.
,
Viswanathan R.
,
Chiruvolu S.
,
Zasadzinski J.
), p. 373-382
article:
Simulation of Langmuir-Blodgett Film Surface Stm Images
(
Agabekov V.
,
Zhavnerko G.
,
Bar G.
,
Cantow H.
), p. 383-386
article:
Tunneling Magnetoresistance in Ferromagnetic Junctions: Bias Dependence
(
Barnaś J.
,
Lee S.
,
Holody P.
,
Schelp L.
,
Petroff F.
,
Fert A.
), p. 387-391
article:
Near Field Optical Microscopy and Spectroscopy with STM and AFM Probes
(
Bergossi O.
,
Bachelot R.
,
Wioland H.
,
Wurtz G.
,
Laddada R.
,
Adam P.
,
Bijeon J.
,
Royer P.
), p. 393-398
article:
Atomic Force Microscopy Studies of the Surface Scale Formed During Oxidation of Incoloy Ma956
(
Czyrska-Filemonowicz A.
,
Wasilkowska A.
,
Szot K.
,
Quadakkers W.
), p. 399-402
article:
Determination of the Magnetic Field Distribution in the Bi2212 superconducting Single Crystal by the Scanning EPR-Probe
(
Drulis H.
,
Folcik L.
,
Drulis M.
,
Zaleski A.
,
Suleimanov N.
), p. 403-407
article:
Stm Observed Surface Structures and Magnetic Properties of MBE-Grown Metallic Thin Films
(
Kalinowski R.
,
Baczewski L.
,
Wawro A.
,
Meyer C.
,
Raułuszkiewicz J.
), p. 409-413
article:
Scanning Tunneling Microscopy/Spectroscopy Investigations of the Interference Effects Caused by the Circular Pits on the Thermally Oxidized graphite Surface
(
Klusek Z.
,
Kalinowski M.
,
Olejniczak W.
,
Kobierski P.
), p. 415-420
article:
Local Adhesive Surface Properties Studied by Force Microscopy
(
Lekka M.
,
Lekki J.
,
Marszałek M.
,
Stachura Z.
,
Cleff B.
), p. 421-424
article:
STM Studies of the Proximity Effect in Superconducting Wires with Artificial Pinning Centers
(
Levi Y.
,
Millo O.
,
Rizzo N.
,
Prober D.
,
Motowidlo L.
), p. 425-430
article:
Resonant Tunneling Through Discrete Electronic Levels of a C_{60} Molecule in the Presence of Charging Effects
(
Millo O.
,
Levi Y.
,
Porath D.
), p. 431-435
article:
Nanostructuring and Hardness Investigations of Thin Films by Scanning Force Microscopy
(
Nowicki M.
,
Richter A.
,
Ries R.
,
Oszwałdowski M.
), p. 437-441
article:
STM Observations of Ferromagnetic Clusters
(
Wawro A.
,
Kasuya A.
), p. 443-448
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