Gamma Induced Positron Annihilation: History, Current, and Future Developments

• Authors: F. Selim
• Languages of publication: EN

Abstracts

EN

Positron annihilation spectroscopy is often performed using radioactive sources for bulk measurements or positron beams for depth resolved measurements. Both have many advantages and great capabilities for a variety of applications. In the recent history, we have shown that positron annihilation spectroscopy can be carried out directly using high energy photons without the need for positron source or positron beam. This approach brings unique capabilities for some specific applications and promotes the use of positron annihilation spectroscopy in new areas of materials science and probably in industrial applications. Some of the important applications include developing new nondestructive highly penetrating sensitive probe for structural and engineering materials. It can also greatly advance positron applications in bulk semiconductors, electronic and photonic materials as well as in polymers, ceramics, and liquids. The recently developed γ-induced positron spectroscopy in HZDR in Dresden provides an example of an excellent facility for many of these applications. When incorporated with pulsed accelerators, γ-induced positron annihilation spectroscopy may trigger novel studies of transient states in matter and explore several solid-state processes that take place on short time scale. In this article I will review the history and development of the technique and its incorporation in a wide range of accelerators including table top electron accelerators, pulsed electron accelerators, and Van de Graaff accelerators. Then I will introduce a design for a new γ-induced positron annihilation spectroscopy facility based on using small nuclear research reactors or neutron generators. The paper presents all the possible approaches for γ-induced positron annihilation spectroscopy and discusses its potential and limitations to guide the efforts in further development of the technique and illustrate the unique aspects that the technique can bring to positron science and applications.

Keywords

EN

gamma induced positron spectroscopy; positron transient measurements; thermal neutron capture; proton capture; electron accelerator; Van de Graaff accelerator

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 132
• Issue: 5
• Pages: 1450-1455

Dates

published

2017-11

Contributors

author

F. Selim

• Department of Physics and Astronomy, Bowling Green State University, Bowling Green, Ohio 43403, USA
• Center of Photochemical Sciences, Bowling Green State University, Bowling Green, Ohio 43403, USA

References

• [1] S. Kahana, Phys. Rev. 117, 123 (1960), doi: 10.1103/PhysRev.117.123
• [2] R. Krause-Rehberg, H.S. Leipner, Positron Annihilation in Semiconductors: Defect Studies, Springer Science, 1999, p. 127
• [3] Y.C. Jean, Mater. Sci. Forum 175-178, 59 (1995), doi: 10.4028/www.scientific.net/MSF.175-178.59
• [4] P.J. Schultz, K.G. Lynn, Rev. Mod. Phys. 60, 701 (1988), doi: 10.1103/RevModPhys.60.701
• [5] F. Selim, D. Wells, J. Harmon, J. Williams, J. Appl. Phys. 97, 113539 (2005), doi: 10.1063/1.1925769
• [6] F. Selim, D. Wells, J. Harmon, Rev. Sci. Instrum. 76, 033905 (2005), doi: 10.1063/1.1863772
• [7] F. Selim, Phys. Lett. A 344, 291 (2005), doi: 10.1016/j.physleta.2005.06.051
• [8] C. Davisson, in: Alpha-, Beta- and Gamma-Ray Spectroscopy, 1965, p. 37
• [9] M. Butterling, W. Anwand, T.E. Cowan, A. Hartmann, M. Jungmann, R. Krause-Rehberg, A. Krille, A. Wagner, Nucl. Instrum. Methods Phys. Res. B 269, 2623 (2011), doi: 10.1016/j.nimb.2011.06.023
• [10] F. Selim, D. Wells, J. Harmon, W. Scates, J. Kwofie, R. Spaulding, S. Duttagupta, J. Jones, T. White, T. Roney, Nucl. Instrum. Methods Phys. Res. B 192, 197 (2002), doi: 10.1016/S0168-583X(02)00868-6
• [11] F. Selim, D. Wells, F. Harmon, J. Kwofie, G. Lancaster, J. Jones, in: AIP Conf. Proc., AIP, 2003, p. 499
• [12] F. Selim, D. Wells, J. Harmon, J. Williams, J. Appl. Phys. 97, 113540 (2005), doi: 10.1063/1.1925770
• [13] F. Selim, D. Wells, J. Harmon, J. Kwofie, A. Roy, T. White, T. Roney, Adv. X-ray Anal. 46, 106 (2002) http://icdd.com/resources/axa/vol46/V46_16.pdf
• [14] F. Selim, D. Wells, J. Harmon, J. Kwofie, G. Erikson, T. Roney, Radiat. Phys. Chem. 68, 427 (2003), doi: 10.1016/S0969-806X(03)00249-4
• [15] R. Bondelid, C. Kennedy, Phys. Rev. 115, 1601 (1959), doi: 10.1103/PhysRev.115.1601
• [16] P. Pujari, K. Sudarshan, R. Tripathi, D. Dutta, P. Maheshwari, S. Sharma, D. Srivastava, R. Krause-Rehberg, M. Butterling, W. Anwand, Nucl. Instrum. Methods Phys. Res. B 270, 128 (2012), doi: 10.1016/j.nimb.2011.09.011
• [17] M. Butterling, W. Anwand, G. Brauer, T.E. Cowan, A. Hartmann, M. Jungmann, K. Kosev, R. Krause-Rehberg, A. Krille, R. Schwengner, Physica Status Solidi A 207, 334 (2010), doi: 10.1002/pssa.200925340
• [18] S.M. Beck, M. Butterling, W. Anwand, A. Beck, A. Wagner, G. Brauer, A. Ocherashvili, I. Israelashvili, O. Hen, in: J. Phys. Conf. Series 443, 012076 (2013), doi: 10.1088/1742-6596/443/1/012076
• [19] J. Ji, A. Colosimo, W. Anwand, L.A. Boatner, A. Wagner, P. Stepanov, T. Trinh, M. Liedke, R. Krause-Rehberg, T. Cowan, Sci. Rep. 6, 31238 (2016), doi: 10.1038/srep31238
• [20] Y. Taira, H. Toyokawa, R. Kuroda, N. Yamamoto, M. Adachi, S. Tanaka, M. Katoh, Rev. Sci. Instrum. 84, 053305 (2013), doi: 10.1063/1.4807701
• [21] G. Leinweber, D.P. Barry, M. Trbovich, J. Burke, N. Drindak, H. Knox, R. Ballad, R. Block, Y. Danon, L. Severnyak, Nucl. Sci. Eng. 154, 261 (2006), doi: 10.13182/NSE05-64
• [22] G. Dobmann, N. Meyendorf, E. Schneider, Nucl. Eng. Des. 171, 95 (1997), doi: 10.1016/S0029-5493(96)01319-2
• [23] I.C. Noyan, J.B. Cohen, Residual Stress: Measurement by Diffraction and Interpretation, Springer, 2013
• [24] K. Saarinen, P. Hautojärvi, C. Corbel, Semicond. Semimet. 51, 209 (1998), doi: 10.1016/S0080-8784(08)63057-4

Identifiers

DOI

10.12693/APhysPolA.132.1450