Comparison of Pure and Doped TiO₂ Thin Films Prepared by Sol-Gel Spin-Coating Method

• Authors: N. Çiçek Bezir , A. Evcin , R. Kayali , M. Özen , G. Balyaci
• Languages of publication: EN

Abstracts

EN

In this study, using spin-coating sol-gel method we fabricated TiO₂ thin films, doped with different concentrations (1, 2, and 3 mole %) of Ce, Dy, and Eu. Characterization of the prepared samples was performed by means of the X-ray diffraction, scanning electron microscopy, ultraviolet visible absorption, and differential thermal and thermo gravimetric analysis. X-ray diffraction measurements have shown that in Eu and Dy-doped samples crystal structure consists of mixed rutile and the dominant anatase phases, however the Ce doped samples consist of anatase phase only. Scanning electron microscopy images have revealed that while average thin film thickness of the Dy-doped samples decreases with increasing concentration of Dy, the average film thicknesses of samples doped with Ce and Eu increases with increasing concentrations of these dopants. Ultraviolet visible absorption spectroscopy measurements have shown that while absorbances of the samples doped by 1 and 2 mole % of the dopants have nearly similar properties, these properties differ from each other for 3 mole % of the dopants. Finally, differential thermal and thermo gravimetric analyses have shown that the chemical reactions and weight losses of the samples have occurred at the expected temperatures.

Keywords

EN

68.37.-d; 68.55.-a; 68.60.-p; 78.20.-e; 81.10.Dn; 71.20.Be

Discipline

• 68.37.-d: Microscopy of surfaces, interfaces, and thin films
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 81.10.Dn: Growth from solutions
• 68.55.-a: Thin film structure and morphology(for methods of thin film deposition, film growth and epitaxy, see 81.15.-z)
• 68.60.-p: Physical properties of thin films, nonelectronic
• 71.20.Be: Transition metals and alloys

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 132
• Issue: 3
• Pages: 620-624

Dates

published

2017-09

Contributors

author

N. Çiçek Bezir

• Department of Physics, Faculty of Art and Science, Süleyman Demirel University, 32260 Isparta, Turkey

author

A. Evcin

• Department of Materials Science and Engineering, Faculty of Engineering, Afyon Kocatepe University, 03200 Afyonkarahisar Turkey

author

R. Kayali

• Department of Physics, Faculty of Art and Science, Ömer Halisdemir University, 51200 Nigde, Turkey

author

M. Özen

• Department of Physics, Faculty of Art and Science, Ömer Halisdemir University, 51200 Nigde, Turkey

author

G. Balyaci

• Department of Physics, Faculty of Art and Science, Süleyman Demirel University, 32260 Isparta, Turkey

References

• [1] A.M. Shehap, S. Akil Dana, Int. J. Nanoelectron. Mater. 9, 17 (2016)
• [2] F.E. Ghodsi, F.Z. Tepehan, G.G. Tepehan, Solar Energy Mater. Solar Cells 92, 234 (2008), doi: 10.1016/j.solmat.2007.02.026
• [3] G. Najla, M. Bouaicha, Nanoscale Res. Lett. 7, 357 (2012), doi: 10.1186/1556-276X-7-357
• [4] F. Ghodsi, H. Absalan, Acta Phys. Pol. A 118, 659 (2010), doi: 10.12693/APhysPolA.118.659
• [5] A. Abdolahzadeh Ziabari, F. Ghodsi, Acta Phys. Pol. A 120, 536 (2011), doi: 10.12693/APhysPolA.120.536
• [6] B. Duymaz, Z. Yigit, M. Şeker, F. Dündar, Acta Phys. Pol. A 129, 872 (2016), doi: 10.12693/APhysPolA.129.872
• [7] I. Karabay, S. Aydın Yüksel, F. Ongül, S. Öztürk, M. Aslı, Acta Phys. Pol. A 121, 265 (2012), doi: 10.12693/APhysPolA.121.265
• [8] F.B. Li, X.Z. Li, K.H. Ng, Ind. Eng. Chem. Res. 45, 1 (2006), doi: 10.1021/ie050139o
• [9] E. Le Boulbar, E. Millon, C. Boulmer-Leborgne, C. Cachoncinlle, B. Hakim, E. Ntsoenzok, Thin Solid Films 553, 13 (2014), doi: 10.1016/j.tsf.2013.11.032
• [10] R.S. Ningthoujam, V. Sudarsan, R.K. Vatsa, R.M. Kadam, J. Alloys Compounds 486, 864 (2009), doi: 10.1016/j.jallcom.2009.07.090
• [11] B. Liang, S. Mianxin, Z. Tianliang, Z. Xiaoyong, D. Qingqing, J. Rare Earths 27, 461 (2009), doi: 10.1016/S1002-0721(08)60270-7
• [12] Z. Zhao, Q.G. Zeng, Z.M. Zhang, Z.J. Ding, J. Luminescence 122-123, 862 (2007), doi: 10.1016/j.jlumin.2006.01.310
• [13] C. Leostean, M. Stefan, O. Pana, A.I. Cadis, R.C. Suciu, T.D. Silipas, E. Gautron, J. Alloys Compounds 575, 29 (2013), doi: 10.1016/j.jallcom.2013.04.067
• [14] M. Vaha-Nissi, T. Hirvikorpi, T. Mustonen, M. Karppinen, A. Harlin, Thin Film Deposition Techniques - Step Towards More Sustainable Packages, 2010
• [15] H. Bensouyad, H. Sedrati, H. Dehdouh, M. Brahimi, F. Abbas, H. Akkari, R. Bensaha, Thin Solid Films 519, 96 (2010), doi: 10.1016/j.tsf.2010.07.062
• [16] A. Evcin, D.A. Kaya, Scientific Res. Essays 5, 3682 (2010)
• [17] Ş. Toygun, G. Köneçoğlu, Y. Kalpaklı, J. Engin. Natural Sci. 2013, 456 (2013)
• [18] C.S. Kim, H.D. Jeong, Bull. Korean Chem. Soc. 28, 2333 (2007), doi: 10.5012/bkcs.2007.28.12.2333
• [19] S. Vaclav, B. Snejana, M. Nataliya, Mater. Chem. Phys. 114, 217 (2009), doi: 10.1016/j.matchemphys.2008.09.025
• [20] M. Li, J. He, Mater. Lett. 174, 48 (2016), doi: 10.1016/j.matlet.2016.03.034
• [21] A.Z. Arsad, N.B. Ibrahim, J. Magnetism Magnetic Mater. 410, 128 (2016), doi: 10.1016/j.jmmm.2016.03.013
• [22] M.R. Khanlary, A. Hajinorozi, S. Baghshahi, J. Inorg. Organomet. Polym. 25, 1521 (2015), doi: 10.1007/s10904-015-0271-9
• [23] N. Beji, M. Souli, M. Reghima, S. Azzaza, S. Alleg, N. Kamoun-Turki, Mater. Sci. Semiconductor Proc. 56, 20 (2016), doi: 10.1016/j.mssp.2016.07.013
• [24] R. Salhi, J.-L. Deschanvres, J. Luminescence 176, 250 (2016), doi: 10.1016/j.jlumin.2016.03.011

Identifiers

DOI

10.12693/APhysPolA.132.620