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Number of results
2015 | 128 | 4 | 651-653

Article title

Electron Diffraction Tomography and Dynamical Refinement for Crystal-Structure Characterization of Nanocrystalline Materials

Content

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Languages of publication

EN

Abstracts

EN
Three-dimensional electron diffraction tomography allows one to obtain structure information from nanocrystals. However, in order to get accurate results the dynamical theory must be used due to the strong dynamical interaction between electrons and matter. Full structure refinement using dynamical theory has been in use for some time, in spite of being hampered by the fact that the intensities are very sensitive to variations of thickness and of the orientation of the sample. A remedy to this problem is the technique called precession electron diffraction. The use of precession electron diffraction in combination with electron diffraction tomography results in more accurate structure parameters and lower figures of merit in the structure refinement. The principles of electron diffraction tomography, precession electron diffraction and dynamical refinement will be demonstrated on the structural analysis of a nanowire of Ni₃Si₂.

Keywords

EN

Contributors

author
  • Department of Physics of Materials, Charles University, Prague, Czech Republic
  • Institute of Physics of the Academy of Sciences of the Czech Republic, Prague, Czech Republic
  • Institute of Physics of the Academy of Sciences of the Czech Republic, Prague, Czech Republic
author
  • Institute of Physics of the Academy of Sciences of the Czech Republic, Prague, Czech Republic

References

  • [1] U. Kolb, T. Gorelik, C. Kübel, M.T. Otten, D. Hubert, Ultramicroscopy 107, 507 (2007), doi: 10.1016/j.ultramic.2006.10.007
  • [2] U. Kolb, T. Gorelik, M. Otten, Ultramicroscopy 108, 763 (2008), doi: 10.1016/j.ultramic.2007.12.002
  • [3] R. Vincent, P. Midgley, Ultramicroscopy 53, 271 (1994), doi: 10.1016/0304-3991(94)90039-6
  • [4] J. Spence, Acta Crystallogr. A49, 231 (1993), doi: 10.1107/S0108767392005087
  • [5] L. Palatinus, J. Damien, P. Cuvillier, M. Klementová, W. Shinkler, L. Marks, Acta Crystallogr. A69, 171 (2013), doi: 10.1107/S010876731204946X
  • [6] V. Petříček, M. Dušek, L. Palatinus, The Crystallographic Computing System JANA2006, 2006
  • [7] V. Petříček, M. Dušek, L. Palatinus, Z. Kristallogr. 229, 345 (2014), doi: 10.1515/zkri-2014-1737
  • [8] A. Reader, A. van Ommen, P. Weijs, R. Wolters, D. Oostra, Rep. Prog. Phys. 56, 1397 (1992), doi: 10.1088/0034-4885/56/11/002
  • [9] L. Palatinus, PETS - program for analysis of electron diffraction data, 2011
  • [10] L. Palatinus, G. Chapuis, J. Appl. Crystallogr. 40, 786 (2007), doi: 10.1107/S0021889807029238
  • [11] G. Pilström, Acta Chem. Scand. 15, 893 (1961), doi: 10.3891/acta.chem.scand.15-0893

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv128n444kz
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