Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2015 | 128 | 4 | 557-560

Article title

Combined Atom Probe Tomography and TEM Investigations of CoCrFeNi, CoCrFeNi-Pd_x (x=0.5, 1.0, 1.5) and CoCrFeNi-Sn

Content

Title variants

Languages of publication

EN

Abstracts

EN
The structure of a family of high entropy alloys based on the composition CoCrFeNi, to which Pd and Sn have been added, is presented. The results stem from combined investigations by atom probe tomography as well as by scanning and transmission electron microscopy on samples produced by arc melting. Although CoCrFeNi is of fcc structure, the sample is not homogeneous on atomic scale. The addition of Pd as a fifth element retains the fcc lattice with the indication of the coexistence of at least two additional phases. The addition of Sn changes the general structure considerably.

Keywords

EN

Discipline

Year

Volume

128

Issue

4

Pages

557-560

Physical description

Dates

published
2015-10

Contributors

author
  • GPM-UMR6634-CNRS, University of Rouen, BP12, 76801 Saint-Etienne-du-Rouvray, France
  • GPM-UMR6634-CNRS, University of Rouen, BP12, 76801 Saint-Etienne-du-Rouvray, France
  • GPM-UMR6634-CNRS, University of Rouen, BP12, 76801 Saint-Etienne-du-Rouvray, France
  • Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
author
  • Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
author
  • GPM-UMR6634-CNRS, University of Rouen, BP12, 76801 Saint-Etienne-du-Rouvray, France
author
  • Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
author
  • Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK
author
  • Department of Materials Science and Engineering, The University of Sheffield, Mappin Street, Sheffield S1 3JD, UK

References

  • [1] Y. Zhang, T.T. Zuo, Z. Tang, M.C. Gao, K.A. Dahmen, P.K. Liaw, Z.P. Lu, Prog. Mater. Sci. 61, 1 (2014), doi: 10.1016/j.pmatsci.2013.10.001
  • [2] A. Cunliffe, J. Plummer, I. Figueroa, I. Todd, Intermetallics 2, 204 (2012), doi: 10.1016/j.intermet.2011.12.006
  • [3] R. Raghavan, K.C. Hari Kumar, B.S. Murty, J. Alloys Comp. 54, 152 (2012), doi: 10.1016/j.jallcom.2012.07.105
  • [4] K.G. Pradeep, N. Wanderka, P. Choi, J. Banhart, B.S. Murty, D. Raabe, Acta Mater. 61, 4696 (2013), doi: 10.1016/j.actamat.2013.04.059
  • [5] Z. Wu, H. Bei, F. Otto, G.M. Pharr, E.P. George, Intermetallics 46, 131 (2014), doi: 10.1016/j.intermet.2013.10.024
  • [6] M.H. Tsai, J.W. Yeh, Mater. Res. Lett. 2, 107 (2014), doi: 10.1080/21663831.2014.912690
  • [7] S. Singh, N. Wanderka, K. Kiefer, K. Siemensmeyer, J. Banhart, Ultramicroscopy 111, 619 (2011), doi: 10.1016/j.ultramic.2010.12.001
  • [8] S. Singh, N. Wanderka, B.S. Murty, U. Glatzel, J. Banhart, Acta Mater. 59, 182 (2011), doi: 10.1016/j.actamat.2010.09.023
  • [9] A. Manzoni, H. Daoud, S. Mondal, S. van Smaalen, R. Völkl, U. Glatzel, N. Wanderka, J. Alloys Comp. 552, 430 (2013), doi: 10.1016/j.jallcom.2012.11.074
  • [10] M.J. Yao, K.G. Pradeep, C.C. Tasan, D. Raabe, Scr. Mater. 72-73, 5 (2014), doi: 10.1016/j.scriptamat.2013.09.030
  • [11] U. Dahlborg, J. Cornide, M. Calvo-Dahlborg, T.C. Hansen, Z. Leong, L. Asensio Dominguez, S. Chambreland, A. Cunliffe, R. Goodall, I. Todd, Acta Phys. Pol. A 128, 552 (2015), doi: 10.12693/APhysPolA.128.552
  • [12] Y.F. Kao, T.J. Chen, S.K. Chen, J.W. Yeh, J. Alloys Comp. 488, 57 (2009), doi: 10.1016/j.jallcom.2009.08.090
  • [13] W.R. Wang, W.L. Wang, S.C. Wang, Y.C. Tsai, C. Lai, J.W. Yeh, Intermetallics 26, 44 (2012), doi: 10.1016/j.intermet.2012.03.005

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv128n421kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.