Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2015 | 127 | 2 | 549-551

Article title

Oxidation Kinetics of Thin and Ultrathin Fe Films

Content

Title variants

Languages of publication

EN

Abstracts

EN
We have studied oxidation kinetics of Fe thin films under atmospheric conditions using the fact that metallic iron is a ferromagnet but ultrathin natural iron oxides are practically nonmagnetic at room temperature. As a consequence, oxidation is associated with a loss in ferromagnetism. Fe thin films were deposited onto 1.5 nm V thick buffer layer using UHV magnetron sputtering. As a substrate we have used Si(100) wafers with an oxidised surface. Results show that all samples with an initial Fe thickness greater than 6 nm oxidize practically instantaneously, whereby a constant amount of 2.5 nm of metal is transformed into oxides. For iron thickness lower than 6 nm the time constant for oxidation increases considerably reaching a value of 30 days for the initial Fe thickness equal to 4 nm.

Keywords

EN

Contributors

  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
  • NanoBioMedical Centre, Adam Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

References

  • [1] R. Cornell, U. Schwertmann, The Iron Oxides, Wiley, New York 1997
  • [2] M. Monti, B. Santos, A. Mascaraque, O. Rodriguez de la Fuente, M.A. Niño, T.O. Menteş, A. Locatelli, K.F. McCarty, J.F. Marco, J. de la Figuera, J. Phys. Chem. C 116, 11539 (2012), doi: 10.1021/jp300702d
  • [3] L. Smardz, U. Köbler, W. Zinn, J. Appl. Phys. 71, 5199 (1992), doi: 10.1063/1.351378
  • [4] L. Smardz, M. Nowak, M. Jurczyk, Int. J. Hydrogen En. 37, 3659 (2012), doi: 10.1016/j.ijhydene.2011.04.039
  • [5] K. Smardz, L. Smardz, Phys. Status Solidi B 243, 223 (2006), doi: 10.1002/pssb.200562419
  • [6] See for example, The Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface, Eds. C.R. Helms, B.E. Deal, Plenum, New York 1988
  • [7] L. Smardz, K. Smardz, Mater. Sci.-Poland 24, 821 (2006)
  • [8] A. Marczyńska, B. Szymański, J. Skoryna, L. Smardz, Acta Phys. Pol. A 127, 552 (2015), doi: 10.12693/APhysPolA.127.552
  • [9] L. Smardz, Solid State Commun. 112, 693 (1999), doi: 10.1016/S0038-1098(99)00426-3

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv127n2127kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.