Multispectral Laser Head for Terrain Identification and Analysis

• Authors: Z. Mierczyk , M. Zygmunt , M. Kaszczuk , M. Muzal
• Languages of publication: EN

Abstracts

EN

The reflectance profilometer, constructed in Institute of Optoelectronics, Military University of Technology, is an optoelectronic device based on the laser remote sensing technique, designed for use on unmanned aerial vehicles. The main task of the profilometer is to analyze the reflectance signals for laser radiation from the multispectral range: 850, 905, and 1550 nm. On the basis of the analysis the profilometer enables two fundamental functions: to define the shape of the ground and identify elements of terrain coverage, along with analysis of its physicochemical properties. The reflectance profilometer is a system based on a modern concept of measurement, allowing to obtain unique information about tested objects, whose measurements or detection are not possible by means of thermal imaging systems and systems operating in the visible range. The received information is visualized in 3D format, which allows for more accurate, precise and comprehensive way of analyzed area model presentation.

Keywords

EN

05.70.Ce; 65.40.G-; 42.62.-b

Discipline

• 42.62.-b: Laser applications
• 05.70.Ce: Thermodynamic functions and equations of state(see also 51.30.+i Thermodynamic properties, equations of state in physics of gases; for equations of state of specific substances, see 64.30.-t; for equations of state of nuclear matter, and of neutron-star matter, see 21.65.Mn and 26.60.Kp, respectively; see also 95.30.Tg in astronomy; for thermodynamic properties of superconductors, see 74.25.Bt)
• 65.40.G-: Other thermodynamical quantities(for magnetocaloric effect, see 75.30.Sg)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2013
• Volume: 124
• Issue: 3
• Pages: 502-504

Dates

published

2013-09

Contributors

author

Z. Mierczyk

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

author

M. Zygmunt

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

author

M. Kaszczuk

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

author

M. Muzal

• Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland

References

• [1] C.S. Fox, The Infrared and Electro-Optical Systems Handbook, Infrared Information Analysis Center and SPIE Optical Engineering Press, Belingham, Washington 1993
• [2] T.A. Warner, M.D. Nellis, G.M. Foody, The SAGE Handbook of Remote Sensing, Sage Publications, London 2009
• [3] W.G. Rees, Physical Principles of Remote Sensing, Cambridge University Press, Cambridge 2001
• [4] M. Kaszczuk, Z. Mierczyk, M. Zygmunt, W. Piotrowski, J. Mierczyk, Proc. SPIE 8040, 80400S (2011)

Identifiers

DOI

10.12693/APhysPolA.124.502