Electronic Transport Properties and Growth Mechanisms of Ni-Fe/Au/Co/Au Multilayers from In Situ Conduction Measurements

• Authors: M. Błaszyk , M. Kempiński , K. Buchta , P. Chomiuk , T. Luciński
• Languages of publication: EN

Abstracts

EN

In the following we present the role of surface scattering at Au/Co and Au/Ni-Fe interfaces in Ni-Fe/Au/Co/Au multilayers deposited in different temperatures. Specularity parameter, which describes the electron scattering, is calculated from fitting in situ collected conductance data with the Fuchs-Namba-Tesanovic model. Application of the parallel resistors model enabled to depict changes between Au/Co and Au/Ni-Fe interfaces within multilayers for each repetition. The correlation between enhanced grain boundary scattering for higher deposition temperatures and surface roughness of Ni-Fe/Au/Co/Au multilayers is found.

Keywords

EN

73.50.-h; 73.61.-r; 75.70.Cn; 72.15.-v

Discipline

• 73.61.-r: Electrical properties of specific thin films(for optical properties of thin films, see 78.20.-e and 78.66.-w; for magnetic properties of thin films, see 75.70.-i)
• 72.15.-v: Electronic conduction in metals and alloys
• 73.50.-h: Electronic transport phenomena in thin films(for electronic transport in mesoscopic systems, see 73.23.-b; see also 73.40.-c Electronic transport in interface structures; for electronic transport in nanoscale materials and structures, see 73.63.-b)
• 75.70.Cn: Magnetic properties of interfaces (multilayers, superlattices, heterostructures)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 118
• Issue: 5
• Pages: 861-863

Dates

published

2010-11

Contributors

author

M. Błaszyk

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

M. Kempiński

• Physics Department, A. Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland

author

K. Buchta

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

P. Chomiuk

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

T. Luciński

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

References

• 1. F.B. Mancoff, J.H. Dunn, B.M. Clemens, R.L. White, Appl. Phys. Lett. 77, 1879 (2000)
• 2. F. Stobiecki, B. Szymański, T. Luciński, J. Dubowik, M. Urbaniak, K. Roell, J. Magn. Magn. Mater. 282, 32 (2004)
• 3. B. Szymański, F. Stobiecki, M. Urbaniak, P. Siffalovic, E. Majkova, Acta Phys. Pol. A 113, 205 (2008)
• 4. B. Szymański, F. Stobiecki, M. Urbaniak, Phys. Status Solidi A 243, 235 (2006)
• 5. M. Błaszyk, T. Luciński, Acta Phys. Pol. A 113, 663 (2008)
• 6. M. Urbaniak, F. Stobiecki, B. Szymański, A. Ehresmann, A. Maziewski, M. Tekielak, J. Appl. Phys. 101, 013905 (2007)
• 7. W. Glapka, P. Kuświk, I. Sveklo, M. Urbaniak, K. Jóźwiak, T. Weis, D. Engel, A. Ehresmann, M. Błaszyk, B. Szymański, A. Maziewski, F. Stobiecki, Acta Phys. Pol. A 115, 348 (2009)
• 8. M. Błaszyk, P. Chomiuk, K. Buchta, T. Luciński, Acta Phys. Pol. A 115, 363 (2009)
• 9. M. Błaszyk, M. Kempiński, B. Andrzejewski, T. Luciński, J. Optoelectron. Adv. Mater. 10, 1038 (2009)
• 10. J. Vancea, H. Hoffmann, Thin Solid Films 92, 219 (1982)
• 11. K. Fuchs, Proc. Camb. Philos. Soc. 34, 100 (1938)
• 12. Y. Namba, Jpn. J. Appl. Phys. 9, 1326 (1970)
• 13. Z. Tesanovic, M.V. Jaric, S. Maekawa, Phys. Rev. Lett. 57, 2760 (1986)
• 14. A.F. Mayadas, M. Schatzkes, Phys. Rev. B 1, 1382 (1970)
• 15. J.R. Sambles, Thin Solid Films 106, 321 (1983)
• 16. G. Reiss, Electronic properties of metallic multilayers, Universität Regensburg, 1989 (in German)
• 17. T. Eckl, G. Reiss, H. Brückl, H. Hoffmann, J. Appl. Phys. 75, 362 (1994)

Identifiers

DOI

10.12693/APhysPolA.118.861