Current-Voltage Characteristics of Nanowires Formed at the Co-Ge_{99.99}Ga_{0.01} Interface

• Authors: M. Wawrzyniak , M. Maćkowski , Z. Śniadecki , B. Idzikowski , J. Martinek
• Languages of publication: EN

Abstracts

EN

We present a method of measurement of the current-voltage (I-V) and conductance-voltage (G-V) characteristics of nanowires with quantum point contact formed at the Co-Ge_{99.99}Ga_{0.01} interface. The effect of the Fermi level pinning leads to the formation of an ohmic contact between Co and Ge_{99.99}Ga_{0.01}. On the measured characteristics, above the threshold value of voltage an exponential current growth is observed. Such effect could be useful in the production of the electronic nanodevices.

Keywords

EN

68.65.-k; 79.60.Jv; 73.63.Rt

Discipline

• 73.63.Rt: Nanoscale contacts
• 79.60.Jv: Interfaces; heterostructures; nanostructures
• 68.65.-k: Low-dimensional, mesoscopic, nanoscale and other related systems: structure and nonelectronic properties(for structure of nanoscale materials, see 61.46.-w; for magnetic properties of interfaces, see 75.70.Cn; for superconducting properties, see 74.78.-w; for optical properties, see 78.67.-n; for transport properties, see 73.63.-b; for thermal properties of nanocrystals and nanotubes, see 65.80.-g; for mechanical properties of nanoscale systems, see 62.25.-g)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2010
• Volume: 118
• Issue: 2
• Pages: 375-378

Dates

published

2010-08

Contributors

author

M. Wawrzyniak

• Faculty of Electronics and Telecommunications, Poznań University of Technology, Piotrowo 3A, 60-965 Poznań, Poland

author

M. Maćkowski

• Faculty of Electronics and Telecommunications, Poznań University of Technology, Piotrowo 3A, 60-965 Poznań, Poland

author

Z. Śniadecki

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

B. Idzikowski

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

J. Martinek

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

References

• 1. Y. Cui, C.M. Lieber, Science 291, 851 (2001)
• 2. J.-R. Kim, H. Oh, H.M. So, J. Kim, J.-J. Kim, Physica E 18, 225 (2003)
• 3. M.-C. Jeong, B.-Y. Oh, M.-H. Ham, J.-M. Myoung, Appl. Phys. Lett. 88, 202105 (2006)
• 4. P.-C. Chang, Z. Fan, C.-J. Chien, D. Stichtenoth, C. Ronning, J.G. Lua, Appl. Phys. Lett. 89, 133113 (2006)
• 5. Z.Y. Fan, D.W. Wang, P.C. Chang, W.Y. Tseng, J.G. Lu, Appl. Phys. Lett. 85, 5923 (2004)
• 6. Z.Y. Fan, J.G. Lu, Appl. Phys. Lett. 86, 123510 (2005)
• 7. J.I. Pascual, J. Méndez, J. Gómez-Herrero, A.M. Baró, N. García, Vu Thien Binh, Phys. Rev. Lett. 71, 1852 (1993)
• 8. J.M. Krans, J.M. van Ruitenbeek, V.V. Fisun, I.K. Yanson, L.J. de Jongh, Nature 375, 767 (1995)
• 9. M. Brandbyge, J. Schiotz, M.R. Sorensen, P. Stoltze, K.W. Jacobsen, J.K. Norskov, L. Olesen, E. Laegsgaard, I. Stensgaard, F. Besenbacher, Phys. Rev. B 52, 8499 (1995); K. Hansen, E. Lagsgaard, I. Stensgaard, F. Besenbacher, Phys. Rev. B 56, 2208 (1997)
• 10. C.J. Muller, J.M. van Ruitenbeek, L.J. de Jongh, Physica C 191, 485 (1992)
• 11. K. Hansen, S.K. Nielsen, E. Lagsgaard, I. Stensgaard, F. Besenbacher, Rev. Sci. Instrum. 71, 1793 (2000)
• 12. J.L. Costa-Krämer, N. García, P. García-Mochales, P.A. Serena, M.I. Marqués, A. Correia, Phys. Rev. B 55, 5416 (1997)
• 13. K. Hansen, S.K. Nielsen, M. Bradbyge, E. Lagsgaard, I. Stensgaard, F. Besenbacher, Appl. Phys. Lett. 77, 708 (2000)
• 14. M. Yoshida, Y. Oshima, K. Takayanagi, Jpn. J. Appl. Phys. 44, L1178 (2005)
• 15. M. Yoshida, Y. Oshima, K. Takayanagi, Appl. Phys. Lett. 87, 33 (2005)
• 16. M. Wawrzyniak, J. Martinek, B. Susła, J. Phys., Conf. Ser. 146, 012035 (2009)
• 17. A. Dimoulas, P. Tsipas, A. Sotiropoulos, E.K. Evangelou, Appl. Phys. Lett. 89, 252110 (2006)
• 18. R.R. Lieten, S. Degroote, M. Kuijk, G. Borghs, Appl. Phys. Lett. 92, 022106 (2008)
• 19. M. Wawrzyniak, Metrol. Measur. Syst. 14, 391 (2007)
• 20. T. Nishimura, K. Kita, A. Toriumi, Appl. Phys. Lett. 91, 123123 (2007)
• 21. M. Wawrzyniak, Metrol. Measur. Syst. 13, 161 (2006)
• 22. D. Wang, J.G. Lu, C.J. Otten, W.E. Buhro, Appl. Phys. Lett. 83, 5280 (2003)
• 23. D.-I. Kim, N. Pradeep, F.W. DelRio, R.F. Cook, Appl. Phys. Lett. 93, 203102 (2008)

Identifiers

DOI

10.12693/APhysPolA.118.375