Thermal Wave Measurements with a Mirage Detection for Investigation of Thermal Diffusivity of GdCa_4O(BO_3)_3 Single Crystals

• Authors: J. Bodzenta , A. Kaźmierczak-Bałata , T. Łukasiewicz , B. Hofman , J. Kucytowski
• Languages of publication: EN

Abstracts

EN

Single crystals of GdCa_4O(BO_3)_3 were examined to determine their thermal properties. Samples were grown by the Czochralski pulling technique. There were three types of samples: a pure crystal, the crystal doped with neodymium (4 at.% of Nd), and the third one doped with ytterbium (7 at.% of Yb). All samples were rectangular prisms with edges parallel to the axes of the optical indicatrix X, Y, Z (principal axes). The thermal diffusivity was determined by means of the thermal wave method with the optical detection of the temperature disturbance based on a mirage effect. Experimental results showed anisotropy of the thermal diffusivity. The thermal diffusivity along Y direction has the highest value while values obtained in X and Z axes are much lower. Dopants cause decrease in the thermal diffusivity for all investigated directions.

Keywords

EN

42.55.Tv; 42.70.Hj; 65.40.-b; 66.30.Xj; 66.70.-f

Discipline

• 66.30.Xj: Thermal diffusivity
• 65.40.-b: Thermal properties of crystalline solids
• 42.70.Hj: Laser materials
• 42.55.Tv: Photonic crystal lasers and coherent effects
• 66.70.-f: Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves(for electronic thermal conduction in metals and alloys, see 72.15.Cz and 72.15.Eb)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2008
• Volume: 114
• Issue: 6A
• Pages: A-27-A-32

Dates

published

2008-12

Contributors

author

J. Bodzenta

• Institute of Physics, Silesian University of Technology, Krzywoustego 2, 44-100 Gliwice, Poland

author

A. Kaźmierczak-Bałata

• Institute of Physics, Silesian University of Technology, Krzywoustego 2, 44-100 Gliwice, Poland

author

T. Łukasiewicz

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland

author

B. Hofman

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland

author

J. Kucytowski

• Institute of Materials Science, University of Silesia, Bankowa 12, 40-007 Katowice, Poland

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Identifiers

DOI

10.12693/APhysPolA.114.A-27