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Number of results
2008 | 114 | 6A | A-121-A-126

Article title

The Influence of a Nanometric Layer with a High Refracting Index οn the Sensitivity οf the Difference Interferometer

Authors

Content

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Languages of publication

EN

Abstracts

EN
Planar waveguides in which some range of the waveguide was modified by depositing on it a layer of some other dielectric, are called composite optical waveguides. Such a structure is based on a planar waveguide obtained by means of ion exchange K^+-Na^+ on glass, and covered by an adequately profiled dielectric layer. This kind of structure is of much interest due to considerable possibilities of taking measurements, which may contribute to a further development of the optoelectronic sensor. Especially required are sensor systems in chemistry, biochemistry, biotechnology, and others. Investigations on the properties of composite layers constitute a continuation of investigations concerning the construction of interferometers, which are very sensitive, cheap and easy to be produced.

Keywords

EN

Contributors

author
  • Institute of Physics, Silesian University of Technology, Krzywoustego 2, 44-100 Gliwice, Poland

References

  • 1. T. Pustelny, Physical and Technical Aspects of Optoelectronic Sensors, Publisher of Silesian University of Technology, Gliwice 2005
  • 2. T. Pustelny, K. Barczak, K. Gut, J. Wojcik, Opt. Appl. 34, 531 (2004)
  • 3. C. Tyszkiewicz, T. Pustelny, J. Phys. IV (France) 129, 169 (2005)
  • 4. T. Pustelny, C. Tyszkiewicz, Opt. Appl. 34, 507 (2004)
  • 5. Z. Qi, A. Yimit, K. Itoh, M. Murabayashi, H. Yanagi, J. Lightwave Technol. 18, 1106 (2000)
  • 6. Z. Qi, K. Itoh, M. Murabayashi, A. Yimit, H. Yanagi, J. Electrochem. Soc. 147, 3940 (2000)
  • 7. K. Gut, Mol. Quant. Acoust. 26, 91 (2005)
  • 8. Z. Qi, A.Yimit, K. Itoh, M. Murabayashi, Opt. Lett. 26, 629 (2001)
  • 9. Z. Qi, A. Yimit, K. Itoh, M. Murabayashi, Opt. Lett. 25, 1427 (2000)
  • 10. B. Pustelny, T. Pustelny, Mol. Quant. Acoust. 28, 223 (2007)
  • 11. R. Rogoziński, K. Gut, P. Karasiński, A. Opilski, Proc. SPIE 3581, 375 (1998)

Document Type

Publication order reference

YADDA identifier

bwmeta1.element.bwnjournal-article-appv114n6a20kz
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