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Number of results
2007 | 112 | 1 | 113-120

Article title

The Surface Hydro-Oxidation of LaNiO_{3-x} Thin Films

Content

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Languages of publication

EN

Abstracts

EN
The high-energy X-ray photoelectron spectroscopy was used to determine the composition and chemical structure of epitaxial LaNiO_{3-x} films obtained by a reactive dc magnetron sputtering. It was found that the oxide and hydroxide species of La and Ni are on the films surface. The thickness of hydroxide enriched layer, estimated from the oxide and hydroxide peak intensities, is about 2 nm.

Keywords

EN

Contributors

  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
author
  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
author
  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
author
  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
author
  • Semiconductor Physics Institute, A. Gostauto 11, 01108 Vilnius, Lithuania
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
  • Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
author
  • Hamburger Synchrotronstrahlungslabor HASYLAB, am Deutschen Elektronen-Synchrotron DESY, Notkestr. 85, 22603 Hamburg, Germany

References

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv112n112kz
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