Structure Perfection Diagnostics of Single Crystals by Means of Diffractometry Measurements Using X-Ray Continuous Spectrum

• Authors: L.I. Datsenko , V.I. Khrupa
• Languages of publication: EN

Abstracts

EN

Determination of the integral characteristics of structural perfection of a real crystal (i.e. Debye-Waller's static factor e^{-L} and coefficient of absorption lids due to diffuse scattering) is especially expedient using the suitably selected wavelengths of the X-ray continuous spectrum by investigation of the thickness I(t), coordinate I(x) as well as amplitude I(W) dependencies of intensities at Lane or Bragg diffraction. Here W is an amplitude of weak ultrasound vibrations excited in a sample for suppression of the Bragg component of reflectivity.

Keywords

EN

61.66.Bi; 81.40.-z; 61.72.Dd

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1994
• Volume: 86
• Issue: 4
• Pages: 579-584

Dates

published

1994-10

Contributors

author

L.I. Datsenko

• Institute of Semiconductor Physics, National Academy of Sciences, Prosp. Nauki 45, 252028 Kiev, Ukraine

author

V.I. Khrupa

• Institute of Semiconductor Physics, National Academy of Sciences, Prosp. Nauki 45, 252028 Kiev, Ukraine