X-Ray Standing Waves: a Powerful Tool for Interface Studies

• Authors: S. Lagomarsino , F. Scarinci , P. Castrucci , C. Giannini
• Languages of publication: EN

Abstracts

EN

The X-ray standing wave technique has demonstrated in these last years to be a powerful method in the study of interfaces. In this paper the fundamentals of the technique will be given, together with examples of applications in the field of metal-semiconductor, of buried semiconductor-semiconductor interfaces and in structural studies of Langmuir-Blodgett films.

Keywords

EN

07.85.+n; 61.10.Lx; 68.35.-p

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1994
• Volume: 86
• Issue: 4
• Pages: 553-566

Dates

published

1994-10

Contributors

author

S. Lagomarsino

• Istituto Elettronica Stato Solido, CNR, V. Cineto Romano, 42 00156 Rome, Italy

author

F. Scarinci

• Istituto Elettronica Stato Solido, CNR, V. Cineto Romano, 42 00156 Rome, Italy

author

P. Castrucci

• Phys. Dep., Univ. Camerino, 62032 Camerino, Italy

author

C. Giannini

• CNRSM, 72023 Mesagne, Italy