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1993 | 84 | 4 | 801-803

Article title

Mechanism of Thermal Interaction of In with GaAs

Content

Title variants

Languages of publication

EN

Abstracts

EN
General behavior of In/GaAs couple heat-treated at 570°C for 2 hours was studied with secondary-ion-mass spectrometry, scanning electron microscopy, Rutherford backscattering spectroscopy and Nomarski microscopy. It is shown that, besides the well-known InGaAs crystallites which epitaxially grow upon dissolution of the substrate, In interacts with the substrate dislocations to form In(Ga)As dendrites. The driving force for this process is presumably excess arsenic reported to be present in the vicinity of the individual dislocations.

Keywords

EN

Year

Volume

84

Issue

4

Pages

801-803

Physical description

Dates

published
1993-10

Contributors

author
  • Institute of Electronic Technology, Al. Lotników 46, 02-668 Warszawa, Poland
  • Institute of Electronic Technology, Al. Lotników 46, 02-668 Warszawa, Poland
author
  • Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warszawa, Poland
  • Institute for Nuclear Problems, Hoża 69, 00-681 Warszawa, Poland

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv84z447kz
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