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Number of results
1993 | 84 | 4 | 629-632

Article title

Field Ionization of Shallow Acceptors

Content

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Languages of publication

EN

Abstracts

EN
Experimental studies on hole tunneling from the substitutional boron impurity into degenerate valence band of silicon single crystals are presented. The results are interpreted within the framework of acceptor ground state quartet splitting into the Kramers doublet due to presence of random strains and electric field in the lattice.

Keywords

EN

Contributors

author
  • Semiconductor Physics Institute, A. Goštauto 11, 2600 Vilnius, Lithuania
author
  • Semiconductor Physics Institute, A. Goštauto 11, 2600 Vilnius, Lithuania
  • Semiconductor Physics Institute, A. Goštauto 11, 2600 Vilnius, Lithuania

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv84z404kz
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