Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
1993 | 84 | 3 | 419-421

Article title

Recent Developments in Scanning Tunneling Microscopy

Authors

Content

Title variants

Languages of publication

EN

Abstracts

EN
Scanning tunneling microscopy and related local probe methods have led to a novel perception of nanometer- and atomic-scale structures and processes. Since the structural information is obtained directly in real space, the scanning probe techniques offer considerable advantages compared with diffraction techniques for the investigation of non-periodic structures at solid surfaces. In addition, the local probe methods allow to study almost any kind of physical property of microstructures with submicron down to atomic resolution.

Keywords

EN

Year

Volume

84

Issue

3

Pages

419-421

Physical description

Dates

published
1993-09

Contributors

  • Institute of Applied Physics and Centre for Microstructural Research, University of Hamburg, Jungiusstrasse 11, 2000 Hamburg 36, Germany

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv84z303kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.