PL EN


Preferences help
enabled [disable] Abstract
Number of results
2016 | 55 | 27-37
Article title

Determination of Accumulated Electrons at PET Surface Using Mirror Effect Phenomena in SEM

Content
Title variants
Languages of publication
EN
Abstracts
EN
An experimental-theoretical investigation have been presented to exploring phenomena of mirror effect. The Polyethylene Terephthalate (PET) material is chosen to be a case study throughout this work. Where the scanning electron microscope (SEM) is used for executing the experiments. Attention has been focused on determination of the number of electrons that accumulated at PET surface, since it is regarded to be the most important factor for producing mirror effect images. Thus two different procedures are produced to achieve such a task namely Magnification Factor Method and Disappearing Method. Results obtained from these two approaches have clearly shown that mirror effects can accurately be used as an excellent tool to determine dielectric constant of insulator.
Discipline
Year
Volume
55
Pages
27-37
Physical description
Contributors
  • Physics Department, College of Education, Al-Mustansiriyah University, Baghdad, Iraq
author
  • Physics Department, College of Education, Al-Mustansiriyah University, Baghdad, Iraq
author
  • Physics Department, College of Education, Al-Mustansiriyah University, Baghdad, Iraq
References
  • [1] F. Croccolo, M. Mancin, M. Milani and C. Riccardi, Characterizations of The Mirror Effect Induced From a PET Sample In SEM and FIB, Proc. Sum. Sch. Milano, Italy (2008a).
  • [2] B. Hafner, Scanning Electron Microscopy, Primer University of Minnesota, (2007).
  • [3] O. Jbara, S. Fakhfakh, M. Belhaj and S. Rondot, (2004). Charge implantation measurement on electron-irradiated insulating materials by means of a SEM Technique, Microsc. Microanal. 10 (2004) 697.
  • [4] D. Clarke and P. Stuart, An anomalous contrast effect in the Scanning Electron Microscope, J. Phys. E: Sci. Instrum. 3 (1970) 705.
  • [5] T. Shaffner and R. Van Veld, Charging’ effects in the scanning electron microscope, J. Phys E: Sci. Instrum. 4 (1970) 633.
  • [6] F. Croccolo and C. Riccardi, Observation of the ion-mirror effect during microscopy of insulating materials, J. Microsc. 229 (2008b) 39.
  • [7] M. Belhaj, O. Jbara, S. Odof, K. Msellak, E. Rau, E., and Andrianov, An anomalous contrast in Scanning Electron Microscopy of insulators: The Pseudo-Mirror Effect, Scanning, 88 (2000) 352.
  • [8] B. Vallayer, G. Blaise and D. Treheux, Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties, Rev. Sci. Instr. 70 (1999) 3102.
  • [9] M. Belhaj, O. Jbara, M. Filippov, E. Rau and M. Andrianov, Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods, Appl. Surf. Sci. 177 (2001) 58.
  • [10] H. Al-Obaidi, F. Al-Saymary and A. Ali, PET Mirror Images Characterizations, Proc. Summ. Scho, Sept. 8th Oct. 8th, (2008), Milano, Italy.
  • [11] M. Milani, C. Savoia, and D. Bigoni, “Electron Mirroring: Control of electron transport and understanding of physical processes from SEM images”., Proceedings of ITP2009, Interdisciplinary Transport Phenomena VI: Fluid, Thermal, Biological, Materials and Space Sciences, Volterra, Italy (2009).
  • [12] T. H. Abbood, Formal Investigation of the Mirror Effect in SEM, Ph.D. Thesis, Physics Departement, Almustansiriah University, Baghdad, Iraq (2011).
  • [13] O. Jbara, S. Fakhfakh, M. Belhaj, S. Rondot, A. Hadjadj and J. Patat, Charging effects of PET under electron beam irradiation in a SEM, J. Phys. D: Appl. Phys. 41 (2008) 1.
  • [14] S. Fakhfakh, O. Jbara, M. Belhaj, S. Rondot, D. Mouze, and Z. Fakhfakh, Study of electrical properties of silica glasses, intended for FED spaers, under electron irradiation, J. Appl. Phys.104 (2008a).
  • [15] Fakhfakh, S., Jbara, O., Rondot, S., Rau, E. and Fakhfakh, Z., An experimental approach for measuring surface potential and second crossover energy in insulators, J. Phys. D: Appl. Phys. Vol. 41 (2008b).
  • [16] Z. Song, C. Ong and H. Gong, A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiation, J. Appl. Phys. 9 (1996) 79.
Document Type
article
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.psjd-f979df2d-2770-4b00-be7d-814e41f9add6
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.