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PN-ISO 690:2012
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Journal
Metrology and Measurement Systems
2013
|
4
|
Article title
Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors
Authors
Lubomír Grmela
,
Zdenek Sita
,
Vlasta Sedlakova
,
Jiri Majzner
,
Petr Sedlak
,
Josef Sikula
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Languages of publication
PL
Abstracts
Keywords
PL
PTC chip sensors
noise spectroscopy
I-V characteristic non-linearity
quality evaluation
Nauki Techniczne
Publisher
Polska Akademia Nauk
Journal
Metrology and Measurement Systems
Year
2013
Issue
4
Physical description
Contributors
author
Lubomír Grmela
author
Zdenek Sita
author
Vlasta Sedlakova
author
Jiri Majzner
author
Petr Sedlak
author
Josef Sikula
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.oai-journals-pan-pl-90198
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