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PN-ISO 690:2012
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Journal
Metrology and Measurement Systems
2013
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4
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Article title
Laser Reflectance Interferometry System with a 405 Nm Laser Diode for in Situ Measurements of CVD Diamond Thickness
Authors
Maciej Kraszewski
,
Robert Bogdanowicz
Content
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Languages of publication
PL
Abstracts
Keywords
PL
interferometry
thin films
CVD
diamond
in situ measurements
Nauki Techniczne
Publisher
Polska Akademia Nauk
Journal
Metrology and Measurement Systems
Year
2013
Issue
4
Physical description
Contributors
author
Maciej Kraszewski
author
Robert Bogdanowicz
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.oai-journals-pan-pl-90177
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