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PN-ISO 690:2012
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Journal
Metrology and Measurement Systems
2011
|
4
|
Article title
Ultrasonic Spectroscopy of Silicon Single Crystal
Authors
Petr Sedlak
,
Pavel Tofel
,
Vlasta Sedlakova
,
Jiri Majzner
,
Josef Sikula
,
Lech Hasse
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PL
Abstracts
Keywords
PL
non-destructive testing
silicon single crystal
electro-ultrasonic spectroscopy
resonant ultrasonic spectroscopy
Nauki Techniczne
Publisher
Polska Akademia Nauk
Journal
Metrology and Measurement Systems
Year
2011
Issue
4
Physical description
Contributors
author
Petr Sedlak
author
Pavel Tofel
author
Vlasta Sedlakova
author
Jiri Majzner
author
Josef Sikula
author
Lech Hasse
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.oai-journals-pan-pl-89830
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