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Journal
Metrology and Measurement Systems
2011
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1
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Article title
On the Bias of Terminal Based Gain and Offset Estimation Using the ADC Histogram Test Method
Authors
F. Alegria
,
Nestor Tiglao
Content
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Languages of publication
PL
Abstracts
Keywords
PL
analog to digital converter
histogram test method
estimator bias
terminal based
gain
offset
Nauki Techniczne
Publisher
Polska Akademia Nauk
Journal
Metrology and Measurement Systems
Year
2011
Issue
1
Physical description
Contributors
author
F. Alegria
author
Nestor Tiglao
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.oai-journals-pan-pl-89733
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