Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT

• Authors: Piotr Putek , Guillaume Crevecoeur , Marian Slodička , Konstanty Gawrylczyk , Roger van Keer , Luc Dupré
• Languages of publication: PL

Keywords

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defect characterization; electromagnetic inverse problem; two level optimization algorithms; eddy current testing method; sensitivity analysis; Nauki Techniczne

• Publisher: Polska Akademia Nauk
• Journal: Archives of Electrical Engineering
• Year: 2011
• Volume: 60
• Issue: 4

Contributors

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Piotr Putek

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Guillaume Crevecoeur

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Marian Slodička

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Konstanty Gawrylczyk

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Roger van Keer

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Luc Dupré