Wideband spectral emission measurements from laser-produced plasma EUV/SXR source based on a double gas puff target

Arikkatt, Antony Jose; Wachulak, Przemysław; Fiedorowicz, Henryk; Bartnik, Andrzej; Czwartos, Joanna; Arikkatt, Antony Jose; Wachulak, Przemysław; Fiedorowicz, Henryk; Bartnik, Andrzej; Czwartos, Joanna

Journal

Metrology and Measurement Systems

2020 | 27 | 4 |

Article title

Wideband spectral emission measurements from laser-produced plasma EUV/SXR source based on a double gas puff target

Authors

Antony Jose Arikkatt , Przemysław Wachulak , Henryk Fiedorowicz , Andrzej Bartnik , Joanna Czwartos , Antony Jose Arikkatt , Przemysław Wachulak , Henryk Fiedorowicz , Andrzej Bartnik , Joanna Czwartos

Content

Full texts:

oai-journals-pan-pl-117864/full-text/art11.pdf

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Title variants

PL

Wideband spectral emission measurements from laser-produced plasma EUV/SXR source based on a double gas puff target

Languages of publication

EN

Abstracts

Keywords

EN

Plasma Spectroscopy X-ray coherence tomography soft X-ray

PL

Nauki Techniczne

Publisher

Polska Akademia Nauk

Journal

Metrology and Measurement Systems

Year

2020

Volume

27

Issue

4

Physical description

Contributors

author

Antony Jose Arikkatt

author

Przemysław Wachulak

author

Henryk Fiedorowicz

author

Andrzej Bartnik

author

Joanna Czwartos

author

Antony Jose Arikkatt

author

Przemysław Wachulak

author

Henryk Fiedorowicz

author

Andrzej Bartnik

author

Joanna Czwartos

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.oai-journals-pan-pl-117864