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Journal

Metrology and Measurement Systems

2020 | 27 | 4 |

Article title

An assessment of applicability of the two-dimensional wavelet transform to assess the minimum chip thickness determination accuracy

Authors

Damian Gogolewski , Włodzimierz Makieła , Łukasz Nowakowski , Damian Gogolewski , Włodzimierz Makieła , Łukasz Nowakowski

Content

Full texts:
oai-journals-pan-pl-117861/full-text/art08.pdf
oai-journals-pan-pl-117861/full-text/art08.pdf

Title variants

PL
An assessment of applicability of the two-dimensional wavelet transform to assess the minimum chip thickness determination accuracy

Languages of publication

EN

Abstracts

Keywords

EN
PL

Publisher

Polska Akademia Nauk

Journal

Metrology and Measurement Systems

Year

2020

Volume

27

Issue

4

Physical description

Contributors

author
Damian Gogolewski
author
Włodzimierz Makieła
author
Łukasz Nowakowski
author
Damian Gogolewski
author
Włodzimierz Makieła
author
Łukasz Nowakowski

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.oai-journals-pan-pl-117861
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